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Electronics Letters
Volumn 29, Issue 17, 1993, Pages 1544-1545
Calibration of 16-term error model
Author keywords

Microwave measurement; Network analysis
Indexed keywords

ALGORITHMS; CALIBRATION; MATHEMATICAL MODELS; MATRIX ALGEBRA; MEASUREMENT ERRORS; MICROWAVES; NETWORKS (CIRCUITS); STANDARDS; SYSTEMS ANALYSIS;
EID: 0027647689     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19931029     Document Type: Article
Times cited : (25)
References (3)
  • 1
    • 0026394514 scopus 로고
    • 16-term error model and calibration procedure for on-wafer network analysis measurements
    • BUTLER, J. V., RYTTING, D. K., ISKANDER, M. F., POLLARD, R. D., and VAN DEN BOSSCHE, M.: ‘16-term error model and calibration procedure for on-wafer network analysis measurements’, IEEE Trans., 1991, MTT-39, pp. 2211-2217
    • (1991) IEEE Trans. , vol.MTT-39 , pp. 2211-2217
    • BUTLER, J.V.1    RYTTING, D.K.2    ISKANDER, M.F.3    POLLARD, R.D.4    VAN DEN BOSSCHE, M.5
  • 2
    • 0017747923 scopus 로고
    • A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering-parameter measurements, affected by leakage errors
    • SPECIALE, R. A.: ‘A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering-parameter measurements, affected by leakage errors’, IEEE Trans., 1977, MTT-25, pp. 1100-1115
    • (1977) IEEE Trans. , vol.MTT-25 , pp. 1100-1115
    • SPECIALE, R.A.1
  • 3
    • 0026854152 scopus 로고
    • A general approach to network analyzer calibration
    • SILVONEN, K. J.: ‘A general approach to network analyzer calibration’, IEEE Trans., 1992, MTT-40, pp. 754’759
    • (1992) IEEE Trans. , vol.MTT-40 , pp. 754-759
    • SILVONEN, K.J.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.