Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures

IEEE Transactions on Instrumentation and Measurement

Volumn 43, Issue 1, 1994, Pages 18-23

  Heuermann, Holger ^a   Schiek, Burkhard ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CALIBRATION; ERROR CORRECTION; ERRORS; MATHEMATICAL MODELS; MATRIX ALGEBRA; REFLECTOMETERS; ROBUSTNESS (CONTROL SYSTEMS); STANDARDS; VECTORS;

CLOSED FORM THEORY; SELF CALIBRATION PROCEDURE;

ELECTRIC NETWORK ANALYZERS;

EID: 0028372057     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.286348     Document Type: Article

References (11)

1. N. R. Franzen and R. A. Speciale, “A New Procedure for System Calibration and Error Removal in Automatic 5-Parameter Measurements,” Proc. 5th the European Microwave Conference, Hamburg, 1975, pp. 69-73.
2. G. F. Engen and C. A. Hoer, “Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six Port Automatic Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, MTT-27, Dec. 1979, pp. 987-993.
3. R. A. Soares, P. Gouzien, P. Legaud and G. Follot, “A unified mathematical approach to two-port calibration techniques and some applications,” IEEE Transactions on Microwave Theory and Techniques, MTT-37, Nov. 1989, pp. 1660-1674.
4. H. J. Eul and B. Schiek, “Thru-Match-Reflect: One Result of a Rigorous Theory for De-embedding and Network Analyzer Calibration,” Proceedings of the 18th European Microwave Conference, Stockholm, 1988, pp. 909-914.
5. H. J. Eul and B. Schiek, “A Generalized Theory and New Calibration Procedures for Network Analyzer Self-Calibration,” IEEE Transactions on Microwave Theory and Techniques, MTT-39, Apr. 1991, pp. 724-731.
6. H. Heuermann and B. Schiek, “A Generalization of the Txx Network Analyzer Self-Calibration Procedure,” Proc. of the 22th European Microwave Conference, Helsinki, 1992, 907-912.
7. R. A. Speciale, “A Generalization of the TSD Network-Analyzer Calibration Produre,” Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors, IEEE Transactions on Microwave Theory and Techniques, MTT-25, Dec. 1977, pp. 1100-1115.
8. H.-G. Krekels and B. Schiek, “Ein Netzwerkanalysator-Kalibrieral-gorithmus für eine redundante Anzahl an Kalibrierstandards,” Kleinheubacher Berichte 1993, Bd. 37.
9. H. Heuermann and B. Schiek, “Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration,” IEEE Transactions on Instrumentation and Measurement, IM-42, Apr. 1993, pp. 528-531.
10. H. J. Eul and B. Schiek, “Reducing the Number of Calibration Standards for Network Analyzer Calibration,” IEEE Transactions on Instrumentation and Measurement, IM-40, Aug. 1991, pp. 732-735.
11. St. Haffa, D. Hollmann and R. Stowasser, “MM-Wave Wafer Prober Measurement and Calibration,” Workshop of the German IEEE Microwave Theory and Techniques/AP Chapter 1991, Ratingen, pp. 146-165.