Characterization of NbN/AIN/NbN tunnel junctions fabricated without intentional heating

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 3, 1997, Pages 2805-2808

  Iosad, N N ^a   Balashov, D V ^a   Kupriyanov, M Yu ^a   Polyakov, S N ^a   Roddatis, V V ^a  

^a INSTITUTE OF RADIO ENGINEERING AND ELECTRONICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CURRENT DENSITY; LEAKAGE CURRENTS; MAGNETRON SPUTTERING; PHASE COMPOSITION; PRESSURE EFFECTS; SUPERCONDUCTING TRANSITION TEMPERATURE; THERMAL STRESS; TRANSMISSION ELECTRON MICROSCOPY; TUNNEL JUNCTIONS; X RAY DIFFRACTION ANALYSIS;

GAP VOLTAGE; INTRINSIC STRESS;

JOSEPHSON JUNCTION DEVICES;

EID: 0031166098     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.621820     Document Type: Article

References (16)

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