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1
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0024719475
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Digital logic circuits
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S. Hasuo and T. Imamura, “Digital logic circuits,” Proc. IEEE, vol. 77, pp. 1177–1193, 1989.
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(1989)
Proc. IEEE
, vol.77
, pp. 1177-1193
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Hasuo, S.1
Imamura, T.2
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2
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0024719367
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Josephson memory technology
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Y. Wada, “Josephson memory technology,” Proc. IEEE, vol. 77, pp. 1194–1208, 1989.
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(1989)
Proc. IEEE
, vol.77
, pp. 1194-1208
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Wada, Y.1
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3
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0025557346
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An 8-b Josephson digital signal processor
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S. Kotani, A. Inoue, T. Imamura, and S. Hasuo, “An 8-b Josephson digital signal processor,” IEEE J. Solid-State Circuits, vol. 25, pp. 1518–1525, 1990.
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(1990)
IEEE J. Solid-State Circuits
, vol.25
, pp. 1518-1525
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Kotani, S.1
Inoue, A.2
Imamura, T.3
Hasuo, S.4
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4
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36749108668
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High quality refractory Josephson tunnel junctions utilizing thin aluminum layers
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M. Gurvitch, W. A. Washington, and H. A. Huggins, “High quality refractory Josephson tunnel junctions utilizing thin aluminum layers,” Appl. Phys. Lett., vol. 42, pp. 472–474, 1983.
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(1983)
Appl. Phys. Lett.
, vol.42
, pp. 472-474
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Gurvitch, M.1
Washington, W.A.2
Huggins, H.A.3
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5
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0005145324
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High-quality Nb/Al-AlOx/Nb Josephson junction
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S. Morohashi, F. Shinoki, A. Shoji, A. Aoyagi, and H. Hayakawa, “High-quality Nb/Al-AlOx/Nb Josephson junction,” Appl. Phys. Lett., vol. 46, pp. 1179–1181, 1985.
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(1985)
Appl. Phys. Lett.
, vol.46
, pp. 1179-1181
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Morohashi, S.1
Shinoki, F.2
Shoji, A.3
Aoyagi, A.4
Hayakawa, H.5
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6
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0004837419
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Experimental investigations and analysis for high-quality Nb/Al-AlOx/Nb Josephson junctions
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S. Morohashi, S. Hasuo, and T. Yamaoka, “Experimental investigations and analysis for high-quality Nb/Al-AlOx/Nb Josephson junctions,” J. Appl. Phys., vol. 61, pp. 4835–4849, 1987.
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(1987)
J. Appl. Phys.
, vol.61
, pp. 4835-4849
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Morohashi, S.1
Hasuo, S.2
Yamaoka, T.3
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7
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84941870768
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Characteristics of sputtered Nb films for Josephson junctions
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Glasgow
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T. Imamura, T. Shiota, and S. Hasuo, “Characteristics of sputtered Nb films for Josephson junctions,” in Extended Abstract Int. Superconductive Electronics Conf., Glasgow, 1991, p. 29.
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(1991)
Extended Abstract Int. Superconductive Electronics Conf.
, pp. 29
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Imamura, T.1
Shiota, T.2
Hasuo, S.3
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8
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0026839095
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Fabrication of high quality Nb/AlOx-Al/Nb Josephson junctions: I—Sputtered Nb films for junction electrodes
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Mar.
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T. Imamura, T. Shiota, and S. Hasuo, “Fabrication of high quality Nb/AlOx-Al/Nb Josephson junctions: I—Sputtered Nb films for junction electrodes,” IEEE Trans. Appl. Superconduct., vol. 2, pp. 1–14, Mar. 1992.
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(1992)
IEEE Trans. Appl. Superconduct
, vol.2
, pp. 1-14
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Imamura, T.1
Shiota, T.2
Hasuo, S.3
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9
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0000299955
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Modification of tunneling barriers on Nb by a few monolayers of Al
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J. M. Rowell, M. Gurvitch, and J. Geerk, “Modification of tunneling barriers on Nb by a few monolayers of Al,” Phys. Rev. B, vol. 24, pp. 2278–2281, 1981.
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(1981)
Phys. Rev. B
, vol.24
, pp. 2278-2281
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Rowell, J.M.1
Gurvitch, M.2
Geerk, J.3
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10
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0001550570
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X-ray photoemission spectroscopy study of surface oxidation of Nb/Al overlayer structures
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J. Kwo, K. Wertheim, M. Gurvitch, and D. N. Buchanan, “X-ray photoemission spectroscopy study of surface oxidation of Nb/Al overlayer structures,” Appl. Phys. Lett., vol. 40, pp. 675–677, 1982.
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(1982)
Appl. Phys. Lett.
, vol.40
, pp. 675-677
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Kwo, J.1
Wertheim, K.2
Gurvitch, M.3
Buchanan, D.N.4
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12
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0004836860
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Characterization of Nb/AlOx-Al/Nb Josephson junctions by anodization profiles
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T. Imamura and S. Hasuo, “Characterization of Nb/AlOx-Al/Nb Josephson junctions by anodization profiles,” J. Appl. Phys., vol. 66, no. 5, pp. 2173–2180, 1989.
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(1989)
J. Appl. Phys.
, vol.66
, Issue.5
, pp. 2173-2180
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Imamura, T.1
Hasuo, S.2
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13
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33748017419
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Evaluation of AlOx barrier thickness in Nb Josephson junctions using anodization profiles
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T. Imamura and S. Hasuo, “Evaluation of AlOx barrier thickness in Nb Josephson junctions using anodization profiles,” Appl. Phys. Lett., vol. 55, pp. 2550–2552, 1989.
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(1989)
Appl. Phys. Lett.
, vol.55
, pp. 2550-2552
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Imamura, T.1
Hasuo, S.2
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14
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0026116757
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Josephson integrated circuits I. Fabrication technology
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T. Imamura, “Josephson integrated circuits I. Fabrication technology,” Fujitsu Sci. Tech. J., vol. 27, pp. 1–27, 1991.
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(1991)
Fujitsu Sci. Tech. J
, vol.27
, pp. 1-27
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Imamura, T.1
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15
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0005195226
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Cross-sectional transmission electron microscopy observation of Nb/AlOx-Al/Nb Josephson junctions
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T. Imamura and S. Hasuo, “Cross-sectional transmission electron microscopy observation of Nb/AlOx-Al/Nb Josephson junctions,” Appl. Phys. Lett., vol. 58, pp. 645–647, 1991.
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(1991)
Appl. Phys. Lett.
, vol.58
, pp. 645-647
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Imamura, T.1
Hasuo, S.2
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16
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84941871486
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Perkin Elmer PHI
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ESCA Data Book, Perkin Elmer PHI, 1984.
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(1984)
ESCA Data Book
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17
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0005855611
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Use of an electron flood gun to reduce surface charging in x-ray photoelectron spectroscopy
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D. A. Huchital and R. T. McKeon, “Use of an electron flood gun to reduce surface charging in x-ray photoelectron spectroscopy,” Appl. Phys. Lett., vol. 20, pp. 158–159, 1972.
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(1972)
Appl. Phys. Lett.
, vol.20
, pp. 158-159
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Huchital, D.A.1
McKeon, R.T.2
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18
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0024629631
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Effect of intrinsic stress on submicrometer Nb/AlOx/Nb Josephson junctions
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T. Imamura and S. Hasuo, “Effect of intrinsic stress on submicrometer Nb/AlOx/Nb Josephson junctions,” IEEE Trans. Magn., vol. 25, pp. 1119–1122, 1989.
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(1989)
IEEE Trans. Magn.
, vol.25
, pp. 1119-1122
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Imamura, T.1
Hasuo, S.2
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