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Volumn 54, Issue 11, 1983, Pages 6509-6516
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Properties of NbN thin films deposited on ambient temperature substrates
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONS - DIFFRACTION;
MICROSCOPES, ELECTRON;
SPECTROSCOPY, AUGER ELECTRON;
SUPERCONDUCTING DEVICES - JOSEPHSON JUNCTIONS;
SUPERCONDUCTING MATERIALS - THIN FILMS;
NIOBIUM NITRIDE;
NIOBIUM COMPOUNDS;
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EID: 0020845207
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.331881 Document Type: Article |
Times cited : (99)
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References (34)
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