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Volumn 23, Issue 2, 1987, Pages 1472-1475

Fabrication and characteristics of nbn-based josephson junctions for logic LSI circuits

Author keywords

[No Author keywords available]

Indexed keywords


EID: 2542595275     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/TMAG.1987.1065100     Document Type: Article
Times cited : (13)

References (13)
  • 3
    • 0022683237 scopus 로고
    • Ultrahigh-speed logic gate family with Nb/Al-AlOx/Nb Josephson Junctions
    • S. Kotani, N. Fujimaki, T. Imamura and S. Hasuo, “Ultrahigh-speed logic gate family with Nb/Al-AlOx/Nb Josephson Junctions”, IEEE Trans. Electron Devices, vol. ED-33, 379 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , Issue.379
    • Kotani, S.1    Fujimaki, N.2    Imamura, T.3    Hasuo, S.4
  • 4
    • 0021857049 scopus 로고
    • Josephson current deviation in small area junctions with double insulating layers
    • T. Nishinc, Y. Tarutari, and U. Kawabe, “Josephson current deviation in small area junctions with double insulating layers”, J. Vac. Sci. Technol., 83, 20, 1985.
    • (1985) J. Vac. Sci. Technol , vol.83 , Issue.20
    • Nishinc, T.1    Tarutari, Y.2    Kawabe, U.3
  • 5
    • 84939027762 scopus 로고
    • Switching speed of DCL-gates with high-J c Josephson junctions
    • T. Nishino, Y. Tarutani, Y. Hatano, and U. Kawabe, “Switching speed of DCL-gates with high-J c Josephson junctions”, IEEE Trans. Magn., vol. MAG-21, 959 1985.
    • (1985) IEEE Trans. Magn. , vol.MAG-21 , Issue.959
    • Nishino, T.1    Tarutani, Y.2    Hatano, Y.3    Kawabe, U.4
  • 6
    • 0016994817 scopus 로고
    • Capacitance and ellipsometrically determined oxide thickness of Nb-oxide-Pb Josephson tunnel junctions
    • S. Basavaiah and J. H. Greiner, “Capacitance and ellipsometrically determined oxide thickness of Nb-oxide-Pb Josephson tunnel junctions”, J. Appl. Phys., 47, 4201, 1976.
    • (1976) Appl. Phys J. , vol.47 , Issue.4201
    • Basavaiah, S.1    Greiner, J.H.2
  • 7
    • 0021504137 scopus 로고
    • Influences of molecular reflection on the lift-off pattern edge quality
    • K. Arai, F. Yanagawa, and S. Kurosawa, “Influences of molecular reflection on the lift-off pattern edge quality”, J. Vac. Sci. Technol., 82, 658, 1984.
    • (1984) J. Vac. Sci. Technol. , vol.82 , Issue.658
    • Arai, K.1    Yanagawa, F.2    Kurosawa, S.3
  • 8
    • 0020903184 scopus 로고
    • Ar ion bombardment effects of NbN/Pb Josephson junctions with plasma oxidized barriers
    • M. Hikita, K. Takei and M. Igarashi, “Ar ion bombardment effects of NbN/Pb Josephson junctions with plasma oxidized barriers”, J. Appl. Phys., 54, 7066, 1983.
    • (1983) J. Appl. Phys. , vol.54 , Issue.7066
    • Hikita, M.1    Takei, K.2    Igarashi, M.3
  • 9
    • 36549093028 scopus 로고
    • Transmission electron microscope observation of a NbN/Nb oxide/NbN trilayer structure
    • N. Miyamoto, Y. Tarutani, M. Hirano, T. Shimotsu, and U. Kawabe, “Transmission electron microscope observation of a NbN/Nb oxide/NbN t r ilaye r structure”, J. Appl. Phys., 60, 2187, 1986.
    • (1986) J. Appl. Phys. , vol.60 , Issue.2187
    • Miyamoto, N.1    Tarutani, Y.2    Hirano, M.3    Shimotsu, T.4    Kawabe, U.5
  • 10
    • 0015960260 scopus 로고
    • Tunneling in lead-lead oxide-lead junctions
    • S. Basavaiah, J. M. Eldridge, and J. Matisoo, “Tunneling in lead-lead oxide-lead junctions”, J. Appl. Phys., 45 457, 1974.
    • (1974) J. Appl. Phys. , vol.45 , Issue.457
    • Basavaiah, S.1    Eldridge, J.M.2    Matisoo, J.3
  • 11
    • 0021441142 scopus 로고
    • Tunnel barrier shape for rf-oxidized Nb/Pb-alloy junctions
    • J. H. Magerlein, “Tunnel barrier shape for rf-oxidized Nb/Pb-alloy junctions”, J. Appl. phys., 55, 4027, 1984.
    • (1984) J. Appl. Phys. , vol.55 , Issue.4027
    • Magerlein, J.H.1
  • 13
    • 0343657511 scopus 로고
    • Design of 2.5 μm micrometer Josephson current Injection Logic (CIL)
    • T. R. Gheewala, “Design of 2.5 μm micrometer Josephson current Injection Logic (CIL)“, IBM J. Res. Develop., 24, 130, 1980.
    • (1980) IBM J. Res. Develop. , vol.24 , Issue.130
    • Gheewala, T.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.