Cross-Qectional Tem Observation of Nb/AIOx-AI/Nb Junction Structures

IEEE Transactions on Magnetics

Volumn 27, Issue 2, 1991, Pages 3172-3175

  Imamura, T ^a   Haohksuo, S ^a  

^a Fuiitsu Laboratories Ltd ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS - MICROSTRUCTURE; MICROSCOPIC EXAMINATION;

JUNCTION BARRIERS; TEM OBSERVATION;

SUPERCONDUCTING DEVICES;

EID: 0026118961     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.133885     Document Type: Article

References (9)

1. S. Hasuo and T. Imamura, Proc. IEEE, 77, 1177–1193, 1989.
2. M. Gurvitch, M. A. Washington, and H. A. Huggins, Appl. Phys. Lett., 42, 472–474, 1983.
3. J. M. Rowell, M. Gurvitch, and J. Geerk, Phys. Rev. B, 24, 2278–2281, 1981.
4. T. Imamura, and S. Hasuo, Extended Abstract of 1989 Int. Superconductivity Electronics Conf., Tokyo, 1989, 367–370.
5. T. Imamura, FUJITSU Sci. Techn. J., 27, 1991 (to be published).
6. T. Imamura and S. Hasuo, J. Appl. Phys., 66, 2173–2180, 1989.
7. T. Imamura and S. Hasuo, IEEE Trans Magn., 25, 1119–1122, 1989.
8. T. Imamura and S. Hasuo, Appl. Phys. Lett., 55, 2550–2552, 1989.
9. J. P. S. Pringle, Electrochimica, 25, 1403–1421, 1980.