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Volumn 41, Issue 12, 1993, Pages 2311-2316

12 GHz Low-Noise MMIC Amplifier Designed with a Noise Model that Scales with MODFET Size and Bias

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CORRELATION METHODS; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; LUMPED PARAMETER NETWORKS; MATHEMATICAL MODELS; MONOLITHIC INTEGRATED CIRCUITS; RESISTORS; SIGNAL TO NOISE RATIO; THERMAL NOISE;

EID: 0027846865     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.260722     Document Type: Article
Times cited : (15)

References (21)
  • 5
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    • A pseudomorphic MODFET structure with excellent linear power performance at mm-wave frequencies
    • Washington, DC, Dec.
    • G. Zhou, K. T. Chan, B. Hughes, M. Mierzwinski, and H. Kondoh, “A pseudomorphic MODFET structure with excellent linear power performance at mm-wave frequencies,” in IEDM Tech. Dig., Washington, DC, Dec. 1989, pp. 109–112.
    • (1989) IEDM Tech. Dig. , pp. 109-112
    • Zhou, G.1    Chan, K.T.2    Hughes, B.3    Mierzwinski, M.4    Kondoh, H.5
  • 7
    • 0024738288 scopus 로고
    • Modeling of noise parameter of MESFET’s and MODFET’s and their frequency and temperature dependence
    • Sept.
    • M. W. Pospieszalski, “Modeling of noise parameter of MESFET’s and MODFET’s and their frequency and temperature dependence,” IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1340–1350, Sept. 1989.
    • (1989) IEEE Trans. Microwave Theory Tech. , vol.37 , pp. 1340-1350
    • Pospieszalski, M.W.1
  • 8
    • 0026367615 scopus 로고
    • FET noise model and on-wafer measurement of noise parameters
    • June
    • M. W. Pospieszalski, and A. C. Niedzwiecki, “FET noise model and on-wafer measurement of noise parameters,” in MTT-S Dig., June 1991, pp. 1117–1120.
    • (1991) MTT-S Dig. , pp. 1117-1120
    • Pospieszalski, M.W.1    Niedzwiecki, A.C.2
  • 9
    • 0027092244 scopus 로고
    • Direct extraction of all four transistor noise parameters from a single noise figure measurement
    • P. J. Tasker, W. Rienert, J. Braunstein, and M. Schlechtweg, “Direct extraction of all four transistor noise parameters from a single noise figure measurement,” in Proc. 22nd European Microwave Conf., 1992, pp. 157–162.
    • (1992) Proc. 22nd European Microwave Conf. , pp. 157-162
    • Tasker, P.J.1    Rienert, W.2    Braunstein, J.3    Schlechtweg, M.4
  • 10
    • 0027189134 scopus 로고
    • Transistor noise parameter extraction using a 50 Ω measurement system
    • June
    • P. J. Tasker, W. Reinert, B. Hughes, J. Braunstein, and M. Schlechtweg, “Transistor noise parameter extraction using a 50 Ω measurement system,” in IEEE MTT-S Dig., June 1993, pp. 1251–1254.
    • (1993) IEEE MTT-S Dig. , pp. 1251-1254
    • Tasker, P.J.1    Reinert, W.2    Hughes, B.3    Braunstein, J.4    Schlechtweg, M.5
  • 11
    • 0026395570 scopus 로고
    • Technology independent non-quasistatic FET model by direct construction from automatically characterized device data
    • Stuttgart, Germany, Sept.
    • D. E. Root, S. Fan, and J. Meyer, “Technology independent non-quasistatic FET model by direct construction from automatically characterized device data,” in 21st European Microwave Conf. Proc., Stuttgart, Germany, Sept. 1991, pp. 927–932.
    • (1991) 21st European Microwave Conf. Proc. , pp. 927-932
    • Root, D.E.1    Fan, S.2    Meyer, J.3
  • 12
    • 0027542884 scopus 로고
    • Designing FETs for broad noise circles
    • Feb.
    • B. Hughes, “Designing FETs for broad noise circles,” IEEE Trans. Microwave Theory Tech., pp. 190–198, Feb. 1993.
    • (1993) IEEE Trans. Microwave Theory Tech. , pp. 190-198
    • Hughes, B.1
  • 21
    • 0026928230 scopus 로고
    • A temperature noise model for extrinsic FETs
    • Sept.
    • B. Hughes, “A temperature noise model for extrinsic FETs,” IEEE Trans. Microwave Theory Tech., vol. 40, pp. 1821–1832, Sept. 1992.
    • (1992) IEEE Trans. Microwave Theory Tech. , vol.40 , pp. 1821-1832
    • Hughes, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.