Complementary-LVTSCR ESD protection scheme for submicron CMOS IC's

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 2, Issue , 1995, Pages 833-836

  Ker, Ming Dou ^a   Wu, Chung Yu ^a   Chang, Hun Hsien ^a   Cheng, Tao ^a   Wu, Tain Shun ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTROSTATICS; MOS DEVICES; SWITCHING CIRCUITS; THYRISTORS;

ELECTROSTATIC DISCHARGE PROTECTION; LOW VOLTAGE TRIGGER; SHORT CHANNEL NMOS; SWITCHING VOLTAGE;

CMOS INTEGRATED CIRCUITS;

EID: 0029204489     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)