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Volumn , Issue , 1993, Pages 149-156
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Characterization of new failure mechanisms arising from power-pin ESD stressing
a
a
Weitek Corp
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
ELECTRIC CURRENT MEASUREMENT;
ELECTRIC DISCHARGES;
ELECTRIC FAULT LOCATION;
INTEGRATED CIRCUIT TESTING;
LEAKAGE CURRENTS;
SEMICONDUCTOR DEVICE MANUFACTURE;
VLSI CIRCUITS;
HUMAN BODY MODEL ELECTROSTATIC DISCHARGE NETWORKS;
MACHINE MODEL ELECTROSTATIC DISCHARGE NETWORKS;
MICRON DEVICES;
POWER-PIN ELECTROSTATIC DISCHARGE STRESSING;
SUB-MICRON DEVICES;
FAILURE ANALYSIS;
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EID: 0027804559
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (9)
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References (5)
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