Ellipsometry on sputter-deposited tin oxide films: Optical constants versus stoichiometry, hydrogen content, and amount of electrochemically intercalated lithium

Applied Optics

Volumn 37, Issue 31, 1998, Pages 7334-7341

  Isidorsson, Jan ^a   Granqvist, Claes G ^a   Rottkay, Klaus Von ^b   Rubin, Michael ^b  

^a UPPSALA UNIVERSITY   (Sweden)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013369367     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.007334     Document Type: Article

References (35)

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