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Volumn 426, Issue , 1996, Pages 449-454

Optical indices of pyrolytic tin-oxide glass

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELLIPSOMETRY; REFLECTOMETERS; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SURFACE ROUGHNESS; TRANSPARENCY;

EID: 0030402470     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-426-449     Document Type: Conference Paper
Times cited : (73)

References (5)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.