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Volumn 426, Issue , 1996, Pages 449-454
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Optical indices of pyrolytic tin-oxide glass
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEPOSITION;
ELLIPSOMETRY;
REFLECTOMETERS;
SEMICONDUCTING TIN COMPOUNDS;
SEMICONDUCTOR DEVICE MODELS;
SEMICONDUCTOR DEVICE STRUCTURES;
SURFACE ROUGHNESS;
TRANSPARENCY;
OPTICAL INDICES;
SPECTRAL TRANSMITTANCE;
TRANSPARENT CONDUCTORS;
SEMICONDUCTING GLASS;
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EID: 0030402470
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-426-449 Document Type: Conference Paper |
Times cited : (73)
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References (5)
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