Electrochromism in lithiated Sn oxide: Mössbauer spectroscopy data on valence state changes

Journal of Applied Physics

Volumn 80, Issue 4, 1996, Pages 2367-2371

  Isidorsson, J ^a   Granqvist, C G ^a   Haggstrom L ^a   Nordstrom E ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001647191     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363071     Document Type: Article

References (96)

1. Solid State Electrochemistry, edited by P. G. Bruce (Cambridge University Press, Cambridge, 1995).
2. C. Julien and G.-A. Nazri, Solid State Batteries: Materials Design and Optimization (Kluwer, Boston, MA, 1994).
3. Proceedings of the Fourth International Symposium Solid Oxide Fuel Cells (SOFC-IV), edited by M. Dokaya, O. Yamamoto, H. Tagawa, and S. C Singhal (The Electrochem Soc., Pennington,NJ, 1995).
4. Gas Sensors, edited by G. Sberveglieri (Kluwer, Dordrecht, 1992).
5. C. G. Granqvist, Handbook of Inorganic Electrochromic Materials (Elsevier, Amsterdam, 1995).
6. P. M. S. Monk, R. J. Mortimer, and D. R. Rosseinsky, Electrochromism: Fundamentals and Applications (VCH,Weinheim, 1995).
7. V. Lantto, in Ref. 4; pp. 117-167.
8. P. Olivi, E. C. Pereira, E. Longo, J. Varella, and L. O. de S. Buthões, J. Electrochem. Soc. 140, L40 (1993).
9. B. Orel and U. Lavrencic-Stangar, J. Electrochem. Soc. 141, L127 (1994).
10. J. Isidorsson and C. G. Granqvist, Solar Energy Mater, Solar Cells (in press).
11. B Stjerma, E. Olsson, and C. G. Granqvist, J. Appl. Phys, 76, 3797 (1994).
12. G. K. Wertheim, M. Campagna, J.-N. Chazalviel, D. N.E. Buchanan, and H. R. Shanks, Appl. Phys, 13, 225 (1977).
13. R. J. Colton, A. M Guzman, and J. W. Rabalais, J. Appl. Phys. 49, 409 (1978): Acc. Chem. Rec. 11, 170 (1978) .
14. R. J. Colton, A. M Guzman, and J. W. Rabalais, J. Appl. Phys. 49, 409 (1978): Acc. Chem. Rec. 11, 170 (1978) .
15. E. P. Denisov, V. I. Kruglov, Yu. A. Salganik, N. A. Tikhonov, and N. P. Sergushin, Izv. Akad, Nauk SSSR Neorg. Mater. 15, 171 (1979) [Inorg, Mater. (USSR) 15, 134 (1979)].
16. E. P. Denisov, V. I. Kruglov, Yu. A. Salganik, N. A. Tikhonov, and N. P. Sergushin, Izv. Akad, Nauk SSSR Neorg. Mater. 15, 171 (1979) [Inorg, Mater. (USSR) 15, 134 (1979)].
17. K. Bange and T. Gambke, Adv. Mater. 2, 10 (1990); C. R. Otterman, A. Temmink, and K. Bange, Thin Solid Films 193/194, 409 (1990); Proc. Soc, Photo-Opt, Instrum, Engr, 1272, 111 (1990); A. Temmink, O, Anderson, K. Bange, H. Hantsche, and X. Yu, Thin Solid Films 192, 211 (1990); Vacuum 41, 1144 (1990); O. Anderson and K, Bange, Fresenius J. Anal. Chem. 341, 74 (1991); K. Bange, T. Gambke, and G. Sparschuh, in Handbook of Optical Properties: Vol. 1. Thin Films for Optical Coatings, edited by R. E. Hummel and K. M. Guenther (CRC, Boca Raton, Florida, 1995), pp. 105-134.
18. K. Bange and T. Gambke, Adv. Mater. 2, 10 (1990); C. R. Otterman, A. Temmink, and K. Bange, Thin Solid Films 193/194, 409 (1990); Proc. Soc, Photo-Opt, Instrum, Engr, 1272, 111 (1990); A. Temmink, O, Anderson, K. Bange, H. Hantsche, and X. Yu, Thin Solid Films 192, 211 (1990); Vacuum 41, 1144 (1990); O. Anderson and K, Bange, Fresenius J. Anal. Chem. 341, 74 (1991); K. Bange, T. Gambke, and G. Sparschuh, in Handbook of Optical Properties: Vol. 1. Thin Films for Optical Coatings, edited by R. E. Hummel and K. M. Guenther (CRC, Boca Raton, Florida, 1995), pp. 105-134.
19. K. Bange and T. Gambke, Adv. Mater. 2, 10 (1990); C. R. Otterman, A. Temmink, and K. Bange, Thin Solid Films 193/194, 409 (1990); Proc. Soc, Photo-Opt, Instrum, Engr, 1272, 111 (1990); A. Temmink, O, Anderson, K. Bange, H. Hantsche, and X. Yu, Thin Solid Films 192, 211 (1990); Vacuum 41, 1144 (1990); O. Anderson and K, Bange, Fresenius J. Anal. Chem. 341, 74 (1991); K. Bange, T. Gambke, and G. Sparschuh, in Handbook of Optical Properties: Vol. 1. Thin Films for Optical Coatings, edited by R. E. Hummel and K. M. Guenther (CRC, Boca Raton, Florida, 1995), pp. 105-134.
20. K. Bange and T. Gambke, Adv. Mater. 2, 10 (1990); C. R. Otterman, A. Temmink, and K. Bange, Thin Solid Films 193/194, 409 (1990); Proc. Soc, Photo-Opt, Instrum, Engr, 1272, 111 (1990); A. Temmink, O, Anderson, K. Bange, H. Hantsche, and X. Yu, Thin Solid Films 192, 211 (1990); Vacuum 41, 1144 (1990); O. Anderson and K, Bange, Fresenius J. Anal. Chem. 341, 74 (1991); K. Bange, T. Gambke, and G. Sparschuh, in Handbook of Optical Properties: Vol. 1. Thin Films for Optical Coatings, edited by R. E. Hummel and K. M. Guenther (CRC, Boca Raton, Florida, 1995), pp. 105-134.
21. K. Bange and T. Gambke, Adv. Mater. 2, 10 (1990); C. R. Otterman, A. Temmink, and K. Bange, Thin Solid Films 193/194, 409 (1990); Proc. Soc, Photo-Opt, Instrum, Engr, 1272, 111 (1990); A. Temmink, O, Anderson, K. Bange, H. Hantsche, and X. Yu, Thin Solid Films 192, 211 (1990); Vacuum 41, 1144 (1990); O. Anderson and K, Bange, Fresenius J. Anal. Chem. 341, 74 (1991); K. Bange, T. Gambke, and G. Sparschuh, in Handbook of Optical Properties: Vol. 1. Thin Films for Optical Coatings, edited by R. E. Hummel and K. M. Guenther (CRC, Boca Raton, Florida, 1995), pp. 105-134.
22. K. Bange and T. Gambke, Adv. Mater. 2, 10 (1990); C. R. Otterman, A. Temmink, and K. Bange, Thin Solid Films 193/194, 409 (1990); Proc. Soc, Photo-Opt, Instrum, Engr, 1272, 111 (1990); A. Temmink, O, Anderson, K. Bange, H. Hantsche, and X. Yu, Thin Solid Films 192, 211 (1990); Vacuum 41, 1144 (1990); O. Anderson and K, Bange, Fresenius J. Anal. Chem. 341, 74 (1991); K. Bange, T. Gambke, and G. Sparschuh, in Handbook of Optical Properties: Vol. 1. Thin Films for Optical Coatings, edited by R. E. Hummel and K. M. Guenther (CRC, Boca Raton, Florida, 1995), pp. 105-134.
23. K. Bange and T. Gambke, Adv. Mater. 2, 10 (1990); C. R. Otterman, A. Temmink, and K. Bange, Thin Solid Films 193/194, 409 (1990); Proc. Soc, Photo-Opt, Instrum, Engr, 1272, 111 (1990); A. Temmink, O, Anderson, K. Bange, H. Hantsche, and X. Yu, Thin Solid Films 192, 211 (1990); Vacuum 41, 1144 (1990); O. Anderson and K, Bange, Fresenius J. Anal. Chem. 341, 74 (1991); K. Bange, T. Gambke, and G. Sparschuh, in Handbook of Optical Properties: Vol. 1. Thin Films for Optical Coatings, edited by R. E. Hummel and K. M. Guenther (CRC, Boca Raton, Florida, 1995), pp. 105-134.
24. A. Guerfi, R. W. Paynter, and L. H. Dao, J. Electrochem. Soc. 142, 3457 (1995).
25. R. Kötz, H. J. Lewerenz, P. Brüesch, and S. Stucki, J. Electroanal. Chem. 150, 209 (1983); R. Kötz, H. Neff, and S. Stucki, J. Electrochem. Soc. 131, 72 (1984).
26. R. Kötz, H. J. Lewerenz, P. Brüesch, and S. Stucki, J. Electroanal. Chem. 150, 209 (1983); R. Kötz, H. Neff, and S. Stucki, J. Electrochem. Soc. 131, 72 (1984).
27. J. Augustynski, M. Koudelka, J. Sanchez, and B. E. Conway, J. Electroanal Chem. 160, 233 (1984).
28. H. Y. Hall and P. M. A. Sherwood, J. Chem. Soc. Faraday Trans, 1 80, 135 (1984).
29. M. Peuckert, Surf. Sci. 141, 500 (1984); J. Electroanal. Chem. 185, 379 (1985)
30. M. Peuckert, Surf. Sci. 141, 500 (1984); J. Electroanal. Chem. 185, 379 (1985)
31. J. E. Ferrer and L. Victori, Afinidad 447, 281 (1993)
32. N. Özer, Thin Solid Films 214, 17 (1992).
33. K. Nagase, Y. Shimizu, N. Miura, and M. Yamazoe, J. Ceram. Soc. Japan 101, 1032 (1993).
34. B. A. L. De Mishima, T. Ohtsuka, H. Konno, and N. Sato, Electrochim. Acta 36, 1485 (1991) .
35. Y. Fujita, K. Miyazaki, and C. Tatsuyama, Jpn. J. Appl. Phys. 24, 1082 (1985).
36. E. Andrukaitis, P. W. M. Jacobs, and J. W. Lorimer, Solid State Ionics 27. 19 (1988).
37. H. Suiyang, C. Fenbo, and Z. Jicai, in Solid State Devices, edited by B. V. R. Chowdari and S. Radhakrishna (world Scientific, Singapore, 1988),pp. 521-526.
38. A. M. Anderson, W. Estrada, C. G. Granqvist, A. Gorenstein, and F. Decker, Proc. Soc. Photo-Opt. Instrum. Engr, 1272, 96 (1990).
39. M. Chigane and M. Ishikawa, J. Chem Soc, Faraday Trans. 1 88, 2203 (1992).
40. X. Hu, X. Chen, and M. G. Hutchins. Proc. soc. Photo-Opt. Instrum. Engr. 1728. 73 (1992).
41. D. A. Wruck and M. Rubin, J. Electrochem. Soc. 140, 1097 (1993).
42. M. Kitao, K. Izawa, K. Urabe, T. Komatsu, S. Kuwano, and S. Yamada, Jpn. J. Appl. Phys. 33, 6656 (1994).
43. Xu Yanzhong, Qiu Muqing, Qui Sichou, Dai Jing, Huang Hanrou, and Cao Guangjun, J. Phys. III (France) 5, 1491 (1995).
44. N. Kumagai, K. Tanno, T. Nakajima, and N. Watanabe, Electrochim, Acta 28, 17 (1983).
45. M. A. B. Gomes, L. O. de S. Bulhoes, S. C. de Castro, and A. J. Damiao, J. Electrochem. Soc. 137, 3067 (1990).
46. M. Hüppauf and B. Lengeler, J. Electrochem. Soc. 140, 598 (1993).
47. S. K. Deb, Phys. Rev. B 16, 1020 (1977).
48. P. Gérard, A. Deneuville, and R. Courths, Thin Solid Films 71, 221 (1980).
49. J. Livage and J. Lemerle, Ann. Rev. Mater. Sci. 12, 103 (1982); A. Chemseddine, R. Morineau, and J. Livage, Solid State Ionics 9/10, 357 (1983).
50. J. Livage and J. Lemerle, Ann. Rev. Mater. Sci. 12, 103 (1982); A. Chemseddine, R. Morineau, and J. Livage, Solid State Ionics 9/10, 357 (1983).
51. J. V. Gabrusenoks, P. D. Cikmach, A. R. Lusis, J. J. Kleperis, and G. M. Ramans, Solid State Ionics 14, 25 (1984); J. J. Kleperis, P. D. Cikmach, and A. R. Lusis, Phys. Status Solidi A 83, 291 (1984).
52. J. V. Gabrusenoks, P. D. Cikmach, A. R. Lusis, J. J. Kleperis, and G. M. Ramans, Solid State Ionics 14, 25 (1984); J. J. Kleperis, P. D. Cikmach, and A. R. Lusis, Phys. Status Solidi A 83, 291 (1984).
53. S. Doeuff and C. Sanchez, C. R. Acad, Sci. Paris,. Sér, II 309, 531 (1989).
54. M. Nabavi, S. Doeuff, C. Sanchez, and J. Livang, Master. Sci. Eng. B 3, 203 (1989).
55. B. Pecquenard, D. Gourier, and N. Baffier, Solid State Ionics 78, 287 (1995).
56. G. W. Simmons, E. Kellerman, and H. Leidheiser, Jr., J. Electrochem. Soc. 123, 1276 (1976); G. W. Simmons, A. Vértes, M. L. Varsányi, and H. Leidheiser, Jr., J. Electrochem. Soc. 126, 187 (1979).
57. G. W. Simmons, E. Kellerman, and H. Leidheiser, Jr., J. Electrochem. Soc. 123, 1276 (1976); G. W. Simmons, A. Vértes, M. L. Varsányi, and H. Leidheiser, Jr., J. Electrochem. Soc. 126, 187 (1979).
58. Z. Bonchev, A. Jordanov, and A. Minkova, Nucl. Instrum. Methods 70, 36 (1969).
59. S. Collins, T. Kachnowski, N. Benczer-Koller, and M. Pasternak, Phys. Rev. B 19, 1369 (1979).
60. E. Leja, J. Korecki, K. Krop, and K. Toll, Thin Solid Films 59, 147 (1979).
61. H. J. Neumann, P. Zeggel, and K. Melzer, J. Non-Cryst. Solids 108, 128 (1989).
62. B. Stjerna, C. G. Granqvist, A. Seidel, and L. Häggström, J. Appl. Phys. 68, 6241 (1990).
63. M. R. Soares, P. H. Dionisio, I. J. R. Baumvol, and W, H, Schreiner, Thin Solid Films 214, 6 (1992).
64. A. Czapla, E. Kusior, and M. Bucko, Thin Solid Films 182, 15 (1989).
65. F. C. Stedile, B. A. S. DeBarros, Jr., C. V. Barros Leite, F. L. Freire, Jr., I. J. R. Baumvol, and W. H. Schreiner, Thin Solid Films 170, 285 (1989).
66. K. Nomura, Y. Ujihira, S. S. Sharma, and K. Matsumoto, Hyperfine Interactions 57, 2015 (1990)
67. M. S. Moreno, J. Desimoni, R. C. Mercader, and A. G. Bibiloni, Hyperfine Interactions 67, 657 (1991).
68. G. Principi, A. Maddalena, A. Gupta, R. D. Maschio, and S. Dire, Hyperfine Interactions 69, 619 (1991).
69. S. S. Sharma, K. Nomura, and Y. Ujihira, J. Mater. Sci. 26, 4104 (1991).
70. M. L. Elidrissi-Moubtassim, J. Olivier-Fourcade, J. Senegas, and J. C. Jumas, Mater. Res. Bull. 28, 1093 (1993).
71. J. Isidorsson, M. Strómme, R. Gȧhlin, G. A. Niklasson, C. G. Granqvist, and L. Häggström, Ionics (Stuttgart) 1, 400 (1995).
72. J. Isidorsson, M. Strómme, R. Gȧhlin, G. A. Niklasson, and C. G. Granqvist, Solid State Commun. (to be published).
73. S. F. Cogan, E. J. Anderson, T. D. Plante, and R. D. Rauh, Appl. Opt. 24, 2282 (1985).
74. O. Bohnke, A. Gire, and J. G. Theobald, Thin Solid Films 247, 51 (1994).
75. M. Sékely, B. Eid, E. Caillot, M. Herlem, A. Etcheberry, C. Mathieu, and B. Fahys, J. Electroanal. Chem. 391, 69 (1995).
76. D. Aurbach and A. Zaban, J. Electroanal. Chem. 348, 155 (1993); 365, 41 (1994); 367, 15 (1994).
77. D. Aurbach and A. Zaban, J. Electroanal. Chem. 348, 155 (1993); 365, 41 (1994); 367, 15 (1994).
78. D. Aurbach and A. Zaban, J. Electroanal. Chem. 348, 155 (1993); 365, 41 (1994); 367, 15 (1994).
79. K. Kanamura, S. Shiraishi, H. Tamura, and Z. I. Takehara, J. Electrochem. Soc. 141, 2379 (1994); K. Kanamura, S. Toriyama, S. Shiraishi, and Z. I. Takehara, ibid. 142, 1383 (1995); K. Kanamura, H. Tamura, S. Shiraishi, and Z. I. Takehara, J. Electroanal. Chem. 349, 49 (1995).
80. K. Kanamura, S. Shiraishi, H. Tamura, and Z. I. Takehara, J. Electrochem. Soc. 141, 2379 (1994); K. Kanamura, S. Toriyama, S. Shiraishi, and Z. I. Takehara, ibid. 142, 1383 (1995); K. Kanamura, H. Tamura, S. Shiraishi, and Z. I. Takehara, J. Electroanal. Chem. 349, 49 (1995).
81. K. Kanamura, S. Shiraishi, H. Tamura, and Z. I. Takehara, J. Electrochem. Soc. 141, 2379 (1994); K. Kanamura, S. Toriyama, S. Shiraishi, and Z. I. Takehara, ibid. 142, 1383 (1995); K. Kanamura, H. Tamura, S. Shiraishi, and Z. I. Takehara, J. Electroanal. Chem. 349, 49 (1995).
82. R. Greef, R. Peat, L. M. Peter, D. Pletcher, and J. Robinson, Instrumental Methods in Electrochemistry (Ellis Horwood, New York, 1990).
83. P. Jernberg and T. Sundqvist, Uppsala University Department of Physics Report No. UUIP-1090 (1983).
84. R. H. Herber, Phys. Rev. B 27, 4013 (1983).
85. P. S. Cook, J. D. Cashion, and P. J. Cassidyk, Fuel 64. 1121 (1985).
86. M. S. Moreno and R. C. Mercader, Phys Rev. B 50, 9875 (1994)
87. B. G. Hyde and S. Andersson, Inorganic Crystal Structures (Wiley, New York, 1989).
88. S. Suzuki and M. Mizuhashi, Thin Solid Films 97, 119 (1982).
89. S. Muranaka, Y. Bando, and T. Takada, Thin Solid Films 86, 11 (1981).
90. T. Yamazaki, U. Mizutani, and Y. Iwani, Jpn. J. Appl Phys. 21, 140 (1982).
91. T. Tabuchi, K. Yamagishi, and Y. Tarui, Jpn. J. Appl. Phys. 26, L186 (1987).
92. A. Mani, J. Mater. Sci. Lett. 9, 1106 (1990).
93. H. Tang, R. Liu, H. Zhou, Y. Hsia, Y. Chen, C. Nik, and X. Fu, Hyperfine Interactions 41, 713 (1988).
94. V. Vasu and A. Subrahmanyam, Thin Solid Films 189, 217 (1990).
95. M. Fantini and I. Torriani, Thin Solid Films 138, 255 (1986).
96. JCPDF, 31-0761, National Bureau of Standards (US) Monograph 25, 16, 45 (1979).