Atomic force microscope-based data storage using replicated media

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 4, 1997, Pages 1584-1587

  Terris, B D ^a   Rishton, S A ^b   Mamin, H J ^a   Best, M E ^a   Logan, J A ^a   Rugar, D ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5844242102     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589406     Document Type: Article

References (10)

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10. Park Scientific Inc., Sunnyvale, CA.