Carrier Lifetime Analysis by Photoconductance Decay and Free Carrier Absorption Measurements

Journal of the Electrochemical Society

Volumn 148, Issue 11, 2001, Pages

  Schulze, H J ^a,d   Frohnmeyer, A ^b   Niedernostheide, F J ^a   Hille, F ^b   Tutto P ^c   Pavelka, T ^c   Wachutka, G ^b,d  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c Semiconductor Physics Laboratory RT   (Hungary)

^d ELECTROCHEMICAL SOCIETY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012969473     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1409974     Document Type: Article

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