Temperature and injection dependence of the Shockley-Read-Hall lifetime in electron irradiated n-type silicon

Journal of Applied Physics

Volumn 79, Issue 12, 1996, Pages 9142-9148

  Bleichner, H ^a,b   Jonsson, P ^a,c   Keskitalo, N ^a   Nordlander, E ^a,d  

^a UPPSALA UNIVERSITY   (Sweden)

^b ABB CORPORATE RESEARCH   (Sweden)

^c SUTEC   (Sweden)

^d UNIVERSITY OF GÄVLE   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001548402     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362585     Document Type: Article

References (18)

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