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Volumn 273, Issue 1-3, 2000, Pages 307-313

Effect of the substrate on the structural properties of low temperature microcrystalline silicon films - A Raman spectroscopy and atomic force microscopy investigation

(5) Dirani, E A T a,b Andrade, A M a Noda, L K a Fonseca, F J a Santos, P S a

a UNIVERSITY OF SÃO PAULO (Brazil)

b PONTIFÍCIA UNIVERSIDADE CATÓLICA DE SÃO PAULO (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012925708 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(00)00177-0 Document Type: Article

Times cited : (23)

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