A new approach for SPICE simulation of AlGaAs/GaAs HBT subjected to burn-in test

IEEE Transactions on Electron Devices

Volumn 45, Issue 1, 1998, Pages 326-329

  Sheu, S ^a   Liou, J J ^a   Huang, C I ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012884816     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.658849     Document Type: Article

References (17)

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