메뉴 건너뛰기




Volumn 2000-January, Issue , 2000, Pages 105-111

Formal operator testability methods for behavioral-level DFT using value ranges

Author keywords

Analytical models; Circuit synthesis; Circuit testing; Computational modeling; Computer graphics; Data analysis; Electric variables control; Input variables; Performance analysis; Performance evaluation

Indexed keywords

ANALYTICAL MODELS; COMPUTER GRAPHICS; DATA FLOW ANALYSIS; DATA REDUCTION; DESIGN; ELECTRIC NETWORK ANALYSIS; ELECTRIC VARIABLES CONTROL; SYNTHESIS (CHEMICAL);

EID: 0012142641     PISSN: 15526674     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HLDVT.2000.889569     Document Type: Conference Paper
Times cited : (1)

References (20)
  • 1
    • 0028126250 scopus 로고
    • Genesis: A behavioral synthesis system for hierarchical testability
    • S. Bhatia and N.K. Jha. "Genesis: a behavioral synthesis system for hierarchical testability," Proc. European Design and Test Conf., pp. 272-276, 1994.
    • (1994) Proc. European Design and Test Conf. , pp. 272-276
    • Bhatia, S.1    Jha, N.K.2
  • 2
    • 0029506902 scopus 로고
    • Design for hierarchical testability of RTL circuits obtained by behavioral synthesis
    • I. Ghosh, A. Raghunathan and N.K. Jha. "Design for hierarchical testability of RTL circuits obtained by behavioral synthesis," Proc. Intl. Conf. Computer Design, pp. 173-179, 1995.
    • (1995) Proc. Intl. Conf. Computer Design , pp. 173-179
    • Ghosh, I.1    Raghunathan, A.2    Jha, N.K.3
  • 3
    • 0028747189 scopus 로고
    • Behavioral synthesis for hierarchical testability of controller/data path circuits with conditional branches
    • S. Bhatia and N.K. Jha. "Behavioral synthesis for hierarchical testability of controller/data path circuits with conditional branches," Proc. Intl. Conf. on Computer Design, pp. 91-96, 1994.
    • (1994) Proc. Intl. Conf. on Computer Design , pp. 91-96
    • Bhatia, S.1    Jha, N.K.2
  • 4
    • 0027151454 scopus 로고
    • Behavioral synthesis of highly testable data paths under non-scan and partial-scan environments
    • T.C. Lee, N.K. Jha and W.H. Wolf. "Behavioral synthesis of highly testable data paths under non-scan and partial-scan environments," Proc. Design Automation Conf., pp. 292-297, 1993.
    • (1993) Proc. Design Automation Conf. , pp. 292-297
    • Lee, T.C.1    Jha, N.K.2    Wolf, W.H.3
  • 8
    • 0031652640 scopus 로고    scopus 로고
    • Partial scan selection based on dynamic reachability and observability information
    • M.S. Hsiao, G.S. Saund, E.M. Rudnick and J.H.Patel. "Partial scan selection based on dynamic reachability and observability information," Proc. Intl. Conf. VLSI Design, pp. 174-180, 1998.
    • (1998) Proc. Intl. Conf. VLSI Design , pp. 174-180
    • Hsiao, M.S.1    Saund, G.S.2    Rudnick, E.M.3    Patel, J.H.4
  • 11
    • 84976709672 scopus 로고
    • Constant Propagation with Conditional Branches
    • April
    • M.N. Wegman and F.K. Zadeck. "Constant Propagation with Conditional Branches," ACM Trans. Programming Lang. & Systems, 13(2), April 1991, pp. 181-210.
    • (1991) ACM Trans. Programming Lang. & Systems , vol.13 , Issue.2 , pp. 181-210
    • Wegman, M.N.1    Zadeck, F.K.2
  • 12
    • 0032314037 scopus 로고    scopus 로고
    • TAO: Regular expression based high-level testability analysis and optimization
    • S. Ravi, G. Lakshminarayana, and N. K. Jha. "TAO: Regular expression based high-level testability analysis and optimization," Proc. Intl. Test Conf., pp. 331-340, 1998.
    • (1998) Proc. Intl. Test Conf. , pp. 331-340
    • Ravi, S.1    Lakshminarayana, G.2    Jha, N.K.3
  • 13
    • 84949671493 scopus 로고
    • Arithmetic built-in self test for high-level synthesis
    • N. Mukherjee et al. "Arithmetic built-in self test for high-level synthesis," IEEE VTS 1995.
    • (1995) IEEE VTS
    • Mukherjee, N.1
  • 15
    • 0030672603 scopus 로고    scopus 로고
    • A Testability Analysis Method for Register-Transfer Level Description
    • M. Takahashi, et al. "A Testability Analysis Method for Register-Transfer Level Description," Proc. ASP-Design Automation Conf., pp. 307-312, 1997.
    • (1997) Proc. ASP-Design Automation Conf. , pp. 307-312
    • Takahashi, M.1
  • 17
    • 0031342927 scopus 로고    scopus 로고
    • Testability Enhancement for Behavioral Descriptions Containing Conditional Statements
    • K. A. Ockunzzi and C. A. Papachristou. "Testability Enhancement for Behavioral Descriptions Containing Conditional Statements," Proc. Intl. Test Conf., pp. 236-245, 1997.
    • (1997) Proc. Intl. Test Conf. , pp. 236-245
    • Ockunzzi, K.A.1    Papachristou, C.A.2
  • 18
    • 0033314407 scopus 로고    scopus 로고
    • An Integrated Approach to High-Level Design-For-Testability Using Value-Range and Variable Testability Techniques
    • S. Seshadri and M.S. Hsiao. "An Integrated Approach to High-Level Design-For-Testability Using Value-Range and Variable Testability Techniques," Proc. Intl. Test Conf., pp. 858-867, 1999.
    • (1999) Proc. Intl. Test Conf. , pp. 858-867
    • Seshadri, S.1    Hsiao, M.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.