Partial scan selection based on dynamic reachability and observability information

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1998, Pages 174-180

  Hsiao, Michael S ^a   Saund, Gurjeet S ^a   Rudnick, Elizabeth M ^a   Patel, Janak H ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; INTEGRATED CIRCUIT TESTING; OBSERVABILITY;

HARD TO TEST CIRCUITS; PARTIAL SCAN TECHNIQUES; SOFTWARE PACKAGE IDROPS;

FLIP FLOP CIRCUITS;

EID: 0031652640     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)