Optical constants of (Al0.98Ga0.02)xOy native oxides

Applied Physics Letters

Volumn 73, Issue 24, 1998, Pages 3512-3514

  Knopp, K J ^a   Mirin, R P ^a   Christensen, D H ^a   Bertness, K A ^a   Roshko, A ^a   Synowicki, R A ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b J A WOOLLAM CO INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012014586     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122821     Document Type: Article

References (23)

1. J. M. Dallesasse, N. Holonyak, Jr., A. R. Sugg, T. A. Richard, and N. El-Zein, Appl. Phys. Lett. 57, 2844 (1990).
2. J. M. Dallesasse and N. Holonyak, Jr., Appl. Phys. Lett. 58, 394 (1991).
3. D. L. Huffaker, D. G. Deppe, K. Kumar, and T. J. Rogers, Appl. Phys. Lett. 65, 97 (1994).
4. M. H. MacDougal, H. Zhao, P. D. Dapkus, M. Ziari, and W. H. Steier, Electron. Lett. 30, 1147 (1994).
5. M. Ochiai, G. E. Giudice, H. Temkin, J. W. Scott, and T. M. Cockerill, Appl. Phys. Lett. 68, 1898 (1996).
6. R. L. Naone, E. R. Hegblom, B. J. Thibeault, and L. A. Coldren, Electron. Lett. 33, 300 (1997).
7. R. D. Twesten, D. M. Follstaedt, K. D. Choquette, and R. P. Schneider, Jr., Appl. Phys. Lett. 69, 19 (1996).
8. A. R. Sugg, E. I. Chen, N. Holonyak, Jr., K. C. Hsieh, J. E. Baker, and N. Finnegan, J. Appl. Phys. 74, 3880 (1993).
9. E. F. Schubert, M. Passlack, M. Hong, J. Mannerts, R. L. Opila, L. N. Pfeiffer, K. W. West, C. G. Bethea, and G. J. Zydzik, Appl. Phys. Lett. 64, 2976 (1994).
10. ®) system. The data were acquired and analyzed using WVASE32 analysis software version 3.012. Trade name is to aid in duplicating the measurement and does not imply endorsement by the National Institute of Standards and Technology.
11. J. A. Woollam and P. G. Snyder, in Encyclopedia of Materials Characterization (Butterworth-Heineman, Boston, 1992), p. 401.
12. E. D. Palik, Handbook of Optical Constants of Solids (Academic, San Diego, 1985), p. 429.
13. J. B. Theeten, D. E. Aspnes, and R. P. H. Chang, J. Appl. Phys. 49, 6097 (1978).
14. G. E. Jellison, Jr., Opt. Mater. 1, 151 (1992).
15. A. N. Pikhtin and A. D. Yas'kov, Sov. Phys. Semicond. 12, 622 (1978).
16. D. S. Gerber and G. N. Maracas, IEEE J. Quantum Electron. 29, 2589 (1993).
17. B. Johs, C. M. Herzinger, J. H. Dinan, A. Cornfeld, and J. D. Benson, Thin Solid Films 113-114, 137 (1998).
18. D. E. Aspnes, J. B. Theeten, and F. Hottier, Phys. Rev. B 20, 3292 (1979).
19. T. Takamori, K. Takemasa, and T. Kamijoh, Appl. Phys. Lett. 69, 659 (1996).
20. F. L. Terry, Jr., J. Appl. Phys. 70, 409 (1991).
21. D. P. Docter, J. P. Ibbetson, Y. Gao, U. K. Mishra, T. Liu, and D. E. Grider, J. Electron. Mater. 27, 479 (1998).
22. J. P. Ibbetson (private communication).
23. H. E. Bennett and J. O. Porteus, J. Opt. Soc. Am. 51, 123 (1961).