Fast imaging of hard x rays with a laboratory microscope

Applied Optics

Volumn 39, Issue 19, 2000, Pages 3333-3337

  Bakulin, Alex S ^a   Durbin, Stephen M ^a   Jach, Terrence ^b   Pedulla, Joseph ^c  

^a PURDUE UNIVERSITY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; IMAGE SENSORS; MICROSTRUCTURE; MIRRORS; MULTILAYERS; OPTICAL DESIGN; X RAY MICROSCOPES;

LASER INTERFEROMETRY;

IMAGING SYSTEMS;

EID: 0010932182     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.003333     Document Type: Article

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