New diffractometer for materials science and imaging at HASYLAB beamline G3

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 428, Issue 2, 1999, Pages 570-582

  Wroblewski, T ^a   Clauss, O ^a   Crostack, H A ^a   Ertel, A ^a   Fandrich, F ^a   Genzel, Ch ^a   Hradil, K ^a   Ternes, W ^a   Woldt, E ^a  

^a DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; IMAGING SYSTEMS; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; RECRYSTALLIZATION (METALLURGY); SCINTILLATION COUNTERS; X RAY DIFFRACTION;

MICROCHANNEL PLATE; SOLLER COLLIMATOR;

DIFFRACTOMETERS;

EID: 0032670913     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00144-8     Document Type: Article

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