Hard x-ray quantitative non-interferometric phase-contrast microscopy

Journal of Physics D: Applied Physics

Volumn 32, Issue 5, 1999, Pages 563-567

  Gureyev, T E ^b   Raven, C ^a   Snigirev, A ^a   Snigireva, I ^a   Wilkins, S W ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRY; OPTICAL RESOLVING POWER; SPATIAL VARIABLES MEASUREMENT; SYNCHROTRON RADIATION; X RAYS; COMPUTERIZED TOMOGRAPHY; MICROSCOPIC EXAMINATION; POLYSTYRENES;

NON INTERFEROMETRIC PHASE RETRIEVAL TECHNIQUE; PHASE CONTRAST IMAGING; PHASE CONTRAST TOMOGRAPHY;

IMAGING TECHNIQUES;

NONINTERFEROMETRIC PHASE RETRIEVAL TECHNIQUE; X RAY PHASE CONTRAST MICROSCOPY (XPCM);

EID: 0033531394     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/5/010     Document Type: Article

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