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Volumn 61, Issue , 1996, Pages 19-25

X-ray microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0011741693     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (5)

References (36)
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  • 6
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    • North Holland, Amsterdam, New York, Oxford
    • Koch, E. E. Ed., "Handbook on Synchrotron Radiation" (North Holland, Amsterdam, New York, Oxford 1983), vol. 1a, 1b, 2.
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  • 7
    • 0003571383 scopus 로고
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    • (1994) Synchrotron Radiation Sources - A Primer
    • Winick, H.1
  • 8
    • 0039524135 scopus 로고
    • Springer Series in Optical Sciences, Springer, Berlin Heidelberg New York
    • Schmahl, G., Rudolph, D. Eds. "X-Ray Microscopy", Springer Series in Optical Sciences, vol. 43 (Springer, Berlin Heidelberg New York 1984).
    • (1984) X-Ray Microscopy , vol.43
    • Schmahl, G.1    Rudolph, D.2
  • 9
    • 0003801882 scopus 로고
    • Springer Series in Optical Sciences, Springer, Berlin, Heidelberg, New York
    • Sayre, D., Howells, M., Kirz, J., Rarback, H. eds "X-Ray Microscopy II", Springer Series in Optical Sciences, vol. 56 (Springer, Berlin, Heidelberg, New York 1988).
    • (1988) X-Ray Microscopy II , vol.56
    • Sayre, D.1    Howells, M.2    Kirz, J.3    Rarback, H.4
  • 10
    • 0003437440 scopus 로고    scopus 로고
    • Springer Series in Optical Sciences, Springer, Berlin, Heidelberg, New York
    • Michette, A. G., Morrison, G. R., Buckley, C. J. Eds. "X-Ray Microscopy III", Springer Series in Optical Sciences, vol. 67 (Springer, Berlin, Heidelberg, New York 1992).
    • (1992) X-Ray Microscopy III , vol.67
    • Michette, A.G.1    Morrison, G.R.2    Buckley, C.J.3
  • 11
    • 0003758001 scopus 로고
    • X-Ray Microscopy IV
    • Chernogolovka/Russia, 1993 Bogorodski Pechatnik Publ. Comp., Chernogolovka, Moscow Region
    • Aristov, V. V., Erko, A. I. Eds. "X-Ray Microscopy IV", Proc. Int. Conf. on X-Ray Microscopy, Chernogolovka/Russia, 1993 (Bogorodski Pechatnik Publ. Comp., Chernogolovka, Moscow Region 1995).
    • (1995) Proc. Int. Conf. on X-Ray Microscopy
    • Aristov, V.V.1    Erko, A.I.2
  • 13
    • 0013555514 scopus 로고
    • Ash, E. A., ed, Academic Press, London
    • Haelbich, R. in "Scanned Image Microscopy" (Ash, E. A., ed), (Academic Press, London 1980) p. 413.
    • (1980) Scanned Image Microscopy , pp. 413
    • Haelbich, R.1
  • 27
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    • (1993) Inst. Phys. Conf. Series Bristol , vol.130 , pp. 587
    • Storjohann, I.1    Kunz, C.2    Moewes, A.3    Voss, J.4
  • 30
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    • X-Ray Optics and Microanalysis Conf. UMIST, Manchester, 31.8.-4.9.92 (Kenway, P. B., et al. eds)
    • Voss, J. and Lübberstedt, H. in X-Ray Optics and Microanalysis Conf. UMIST, Manchester, 31.8.-4.9.92 (Kenway, P. B., et al. eds) Inst. Phys. Conf. Series Bristol 130, 591 (1993).
    • (1993) Inst. Phys. Conf. Series Bristol , vol.130 , pp. 591
    • Voss, J.1    Lübberstedt, H.2
  • 32
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    • submitted for publication
    • Föhlisch, A., et al. submitted for publication.
    • Föhlisch, A.1


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