Superhard, conductive coatings for atomic force microscopy cantilevers

Applied Physics Letters

Volumn 79, Issue 19, 2001, Pages 3053-3055

  Ronning, C ^a   Wondratschek, O ^a   Buttner M ^a   Hofsass H ^a   Zimmermann, J ^b   Leiderer, P ^b   Boneberg, J ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010782667     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1415354     Document Type: Article

References (17)

1. See e.g., Atomic Force Microscopy/Scanning Tunneling Microscopy 3, edited by S. H. Cohen (Kluwer-Dordrecht, Academic, 1999).
2. A. Olbrich, B. Ebersberger, and C. Boit, Appl. Phys. Lett. 73, 3114 (1998).
3. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991).
4. M. Böhmisch, F. Burneites, A. Rottenberger, J. Zimmermann, J. Boneberg, and P. Leidver, J. Phys. Chem. B 101, 10162 (1997).
5. M. A. Lantz, S. J. O'Shea, and M. E. Welland, Rev. Sci. Instrum. 69, 1757 (1998).
6. H. Hofsäss and C. Ronning, in Beam Processing of Advanced Materials, edited by J. Singh, S. M. Copley, and J. Mazumder ASM, (1996), p. 29ff.
7. A. Lee and P. A. Dowden, Appl. Phys. A: Solids Surf. 58, 223 (1994).
8. A. O. Sezer and J. I. Brand, Mater. Sci. Eng., B 79, 191 (2001).
9. S. V. Despande, E. Gulari, S. J. Harris, and A. M. Weiner, Appl. Phys. Lett. 65, 1757 (1994).
10. D. C. Reigada, R. Prioli, L. Jacobsohn, and F. L. Freire, Diamond Relat. Mater. 9, 489 (2000).
11. H. Hofsäss, J. Boneberg, and P. Leiderer, German Patent No. 19, 752, 202.5 (25 November 1997).
12. H. Hofsäss, H. Binder, T. Klumpp, and E. Recknagel. Diamond Relat. Mater. 3, 137 (1994).
13. S. Lee, J. Mazurowski, G. Ramseyes, and P. A. Dowben, J. Appl. Phys. 72, 4925 (1992).
14. C. Running and H. Hofsäss, Proceedings of the 12th SMMIB, 9-14 Sept. 2001, Marburg, Germany (unpublished).
15. C. Ronning, U. Griesmeier, M. Gross, H. Hofsäss, R. G. Downiny, and G. P. Lamaze, Diamond Relat. Mater. 4, 666 (1995).
16. J. Eisenmenger, J. Eisenmenges, J. Zimmermann, J. Schiessling, U. Bolz, and P. Leideres, Adv. Solid State Phys. 39. 403 (1999).
17. T. Trenkler et al., J. Vac. Sci. Technol. B 18, 418 (2000).