Electromigration-induced flow of islands and voids on the Cu(001) surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 7, 2000, Pages 4975-4982

  Mehl, Hanoch ^a   Biham, Ofer ^a   Millo, Oded ^a   Karimi, Majid ^b  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b INDIANA UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005079227     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.4975     Document Type: Article

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