Surface electromigration and self-diffusion on gold films studied via scanning tunneling microscopy

Surface Science

Volumn 380, Issue 1, 1997, Pages 100-104

  Shimoni, N ^a   Wolovelsky, M ^a   Biham, O ^a   Millo, O ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

Electromigration; Scanning tunneling microscopy; Surface diffusion; Surface dynamics

Indexed keywords

ACTIVATION ENERGY; DIFFUSION IN SOLIDS; ELECTROMIGRATION; GOLD; MONOLAYERS; POLYCRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA; SURFACE STRUCTURE;

ATOMIC STEPS;

METALLIC FILMS;

EID: 0031141143     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01579-8     Document Type: Article

References (17)

1. P.S. Ho and T. Kwok, Rep. Prog. Phys. 52 (1989) 301.
2. R.W. Vook, Mater. Chem. Phys. 36 (1994) 199.
3. E. Arzt, O. Fraft, W.D. Nix and J.E. Sanchez, Jr., J. Appl. Phys. 76 (1994) 1563.
4. B.H. Jo and R.W. Vook, Thin Solid Films 262 (1995) 129; Appl. Surf. Sci. 89 (1995) 237.
5. B.H. Jo and R.W. Vook, Thin Solid Films 262 (1995) 129; Appl. Surf. Sci. 89 (1995) 237.
6. M. Pannicia, P. Flinn and R. Reifenberger, J. Appl. Phys. 73 (1993) 8189.
7. A. Gladkikh, Y. Lereah, E. Glickman, A. Palevski and J. Schubert, Appl. Phys. Lett. 66 (1995) 1214.
8. R.J. Rous, T.L. Einstein and E.D. Williams, Surf. Sci. 315 (1994) L995.
9. Z. Suo, W. Wang and M. Yang, Appl. Phys. Lett. 64 (1994) 1944.
10. H. Dobbs and J. Krug, J. Phys. 16 (1996) 413.
11. D. Porath, O. Millo and J.I. Gersten, J. Vac. Sci. Technol. B 14 (1996) 30.
12. T.S. Lin and Y.W. Chung, Surf. Sci. 207 (1989) 539.
13. D.R. Peale and B.H. Cooper, J. Vac. Sci. Technol. A 10 (1992) 2210.
14. Balzers Substrate Cleaner, Codes BD 481-900 and BD 481-901.
15. M.A. Dubson, M. Kalka and J. Hwang, Phys. Rev. B 47 (1996) 10044.
16. Y. Li and A.E. DePristo, Surf. Sci. 351 (1996) 189.
17. Y.N. Yang, E.S. Fu and E.D. Williams, Surf. Sci. 356 (1996) 101.