SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 414, Issue 1-2, 1998, Pages

Current-induced surface dislocations on thin gold films

(3) Shimoni, N a Biham, O a Millo, O a

a HEBREW UNIVERSITY OF JERUSALEM (Israel)

Author keywords

Dislocations; Electromigration; Scanning tunneling microscopy; Surface dynamics

Indexed keywords

ANNEALING; DISLOCATIONS (CRYSTALS); ELECTRIC CURRENTS; ELECTROMIGRATION; GOLD; SCANNING TUNNELING MICROSCOPY; SURFACE PHENOMENA; SURFACE STRUCTURE; THIN FILMS;

FLAME ANNEALING; SURFACE DYNAMICS;

METALLIC FILMS;

EID: 0032166028 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00417-8 Document Type: Article

Times cited : (5)

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