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Volumn 67, Issue 5, 1996, Pages 1925-1929
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Design of a "beetle-type" atomic force microscope using the beam deflection technique
a a a a
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0041340412
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1146998 Document Type: Article |
Times cited : (5)
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References (22)
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