Near-infrared contact mode collection near-field optical and normal force microscopy of modulated multiple quantum well lasers

Applied Physics Letters

Volumn 68, Issue 17, 1996, Pages 2337-2339

  Ben Ami, U ^a   Tessler, N ^a   Ben Ami, N ^a   Nagar, R ^a   Fish, G ^a   Lieberman, K ^a   Eisenstein, G ^a   Lewis, A ^a   Nielsen, J M ^a   Moeller Larsen A ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT EMISSION; LIGHT MODULATION; OPTICAL MICROSCOPY; OPTICAL SENSORS; SCANNING; SEMICONDUCTING INDIUM PHOSPHIDE; SIGNAL PROCESSING; SURFACES;

BENT NEAR FIELD OPTICAL ELEMENTS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; NORMAL FORCE ERROR SIGNAL; NORMAL FORCE MICROSCOPY; SPONTANEOUS EMISSION; TOPOGRAPHY;

QUANTUM WELL LASERS;

EID: 0030129489     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115850     Document Type: Article

References (6)

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3. G. Fish, O. Bouevitch, S. Kokotov, K. Lieberman, D. Palanker, I. Turovets, and A. Lewis, Rev. Sci. Instrum. AIP 66, 3942 (1995).
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5. N. Tessler and G. Eisenstein, Appl. Phys. Lett. AIP 62, 10 (1993).
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