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Volumn 122, Issue 2, 2000, Pages 86-91

A study on warpage of flexible SS substrates for large area MCM-D packaging

Author keywords

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Indexed keywords


EID: 0002998050     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.483152     Document Type: Article
Times cited : (14)

References (18)
  • 3
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    • In-Situ Warpage Measurement during Thermal Cycling of Dielectric Coated SS Substrates
    • Tennessee. The ASME International Mechanical Engineering Conference and Exposition, November 14-19, 1999, Nashville, TN
    • Dang, A., Ume, I. C., and Bhattacharya, S., 1999, “In-Situ Warpage Measurement during Thermal Cycling of Dielectric Coated SS Substrates,” ASME Conference, Tennessee. The ASME International Mechanical Engineering Conference and Exposition, November 14-19, 1999, Nashville, TN.
    • (1999) ASME Conference
    • Dang, A.1    Ume, I.C.2    Bhattacharya, S.3
  • 5
    • 0031625756 scopus 로고    scopus 로고
    • Application of Thermoelastic Lamination Theory to Predict Warpage of a Symmetric and Simply Supported PWB During Temperature Cycling
    • Polsky, Y., Ume, C., and Southerlin, W., 1998, “Application of Thermoelastic Lamination Theory to Predict Warpage of a Symmetric and Simply Supported PWB During Temperature Cycling,” Proceedings 48th IEEE Electronic Components and Technology Conference, pp. 345-352.
    • (1998) Proceedings 48Th IEEE Electronic Components and Technology Conference , pp. 345-352
    • Polsky, Y.1    Ume, C.2    Southerlin, W.3
  • 6
    • 0034219497 scopus 로고    scopus 로고
    • A Comparison of PWB Warpage Due to Simulated Infrared and Wave Soldering Processes
    • (accepted for publication)
    • Polsky, Y., Southerlin, W., and Ume, C., 2000, “A Comparison of PWB Warpage Due to Simulated Infrared and Wave Soldering Processes,” IEEE, CPMT, Part C (accepted for publication).
    • (2000) IEEE, CPMT, Part C
    • Polsky, Y.1    Southerlin, W.2    Ume, C.3
  • 10
    • 0027887097 scopus 로고
    • Correlation of Analytical and Experimental Approaches to Determine Thermally Induced PWB Warpage
    • Yeh, C., Ume, C., Fulton, R., Wyatt, K., and Stafford, J., 1993, “Correlation of Analytical and Experimental Approaches to Determine Thermally Induced PWB Warpage,” IeEe Trans. Compon., Hybrids, Manuf. Technol., 16, pp. 986-995.
    • (1993) Ieee Trans. Compon., Hybrids, Manuf. Technol , vol.16 , pp. 986-995
    • Yeh, C.1    Ume, C.2    Fulton, R.3    Wyatt, K.4    Stafford, J.5
  • 14
    • 0027743714 scopus 로고
    • Out-of-Plane Displacement Measurement of Printed Circuit Board by Shadow Moire With Variable Sensitivity
    • ASME EEP, 4-1
    • Han, B., Guo, Y., and Choi, H., 1993, “Out-of-Plane Displacement Measurement of Printed Circuit Board by Shadow Moire With Variable Sensitivity,” Advances in Electronic Packaging, ASME EEP, 4-1, pp. 179-185.
    • (1993) Advances in Electronic Packaging , pp. 179-185
    • Han, B.1    Guo, Y.2    Choi, H.3
  • 15
    • 0005468686 scopus 로고    scopus 로고
    • Measurement of a Thermally Induced Deformation of a BGA Using Phase-Stepping Shadow Moire
    • Wang, Y., and Hassel, P., (editors), 1998, “Measurement of a Thermally Induced Deformation of a BGA Using Phase-Stepping Shadow Moire,” Experimental/Numerical Mechanics in Electronic Packaging, 2, pp. 32-39.
    • (1998) Experimental/Numerical Mechanics in Electronic Packaging , vol.2 , pp. 32-39
    • Wang, Y.1    Hassel, P.2
  • 16
    • 0032083804 scopus 로고    scopus 로고
    • On-line Measurement of a Thermally Induced Warpage of a BGA with a High Sensitive Shadow Moire
    • Wang, Y., and Hassel, P., 1998, “On-line Measurement of a Thermally Induced Warpage of a BGA with a High Sensitive Shadow Moire,” Int. J. Microcircuit Electron. Packag., 21, No. 2, pp. 191-196.
    • (1998) Int. J. Microcircuit Electron. Packag , vol.21 , Issue.2 , pp. 191-196
    • Wang, Y.1    Hassel, P.2
  • 17
    • 0031094653 scopus 로고    scopus 로고
    • System for Real-Time Measurement of Thermally Induced PWB/PWA Warpage
    • Stitler, M. R., and Ume, I. C., 1997, “System for Real-Time Measurement of Thermally Induced PWB/PWA Warpage,” ASME J. Electron. Packag., 119, pp. 1-77.
    • (1997) ASME J. Electron. Packag , vol.119 , pp. 1-77
    • Stitler, M.R.1    Ume, I.C.2
  • 18
    • 0030408751 scopus 로고    scopus 로고
    • In Process Board Warpage Measurement in a Lab Scale Wave Soldering Oven
    • Stitler, M. R., Ume, I. C., and Leutz, B., 1996, “In Process Board Warpage Measurement in a Lab Scale Wave Soldering Oven,” IEEE Trans. Compon., Packag. Manuf. Technol., Part A, 19, pp. 562-569.
    • (1996) IEEE Trans. Compon., Packag. Manuf. Technol , vol.19 , pp. 562-569
    • Stitler, M.R.1    Ume, I.C.2    Leutz, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.