-
1
-
-
0003860827
-
-
Chap. 18, Chapman & Hall, London
-
Tummala, R. R., Nandakumar, G. A., Bolda, F., and Klopfenstein, A., 1997, Microelectronic Packaging Handbook, Chap. 18, Chapman & Hall, London.
-
(1997)
Microelectronic Packaging Handbook
-
-
Tummala, R.R.1
Nandakumar, G.A.2
Bolda, F.3
Klopfenstein, A.4
-
2
-
-
0025209365
-
-
Sens. Actuators B, B1
-
Padmadinata, F. Z., Veerhoek, J. J., Van Dijk, G. J. A., and Huijsing, J. H., 1990, “Microelectronic Skin Electrode,” Sens. Actuators B, B1, pp. 491-49.
-
(1990)
Microelectronic Skin Electrode
, pp. 491-549
-
-
Padmadinata, F.Z.1
Veerhoek, J.J.2
Van Dijk, G.J.A.3
Huijsing, J.H.4
-
3
-
-
0041453895
-
In-Situ Warpage Measurement during Thermal Cycling of Dielectric Coated SS Substrates
-
Tennessee. The ASME International Mechanical Engineering Conference and Exposition, November 14-19, 1999, Nashville, TN
-
Dang, A., Ume, I. C., and Bhattacharya, S., 1999, “In-Situ Warpage Measurement during Thermal Cycling of Dielectric Coated SS Substrates,” ASME Conference, Tennessee. The ASME International Mechanical Engineering Conference and Exposition, November 14-19, 1999, Nashville, TN.
-
(1999)
ASME Conference
-
-
Dang, A.1
Ume, I.C.2
Bhattacharya, S.3
-
4
-
-
0031633698
-
Relative Comparison of PWB Warpage Due to Simulated Infrared and Wave Soldering Processes
-
Southerlin, S., Polsky, Y., and Ume, C., 1998, “Relative Comparison of PWB Warpage Due to Simulated Infrared and Wave Soldering Processes,” Proceedings 48th IEEE Electronic Components and Technology Conference, pp. 807-815.
-
(1998)
Proceedings 48Th IEEE Electronic Components and Technology Conference
, pp. 807-815
-
-
Southerlin, S.1
Polsky, Y.2
Ume, C.3
-
5
-
-
0031625756
-
Application of Thermoelastic Lamination Theory to Predict Warpage of a Symmetric and Simply Supported PWB During Temperature Cycling
-
Polsky, Y., Ume, C., and Southerlin, W., 1998, “Application of Thermoelastic Lamination Theory to Predict Warpage of a Symmetric and Simply Supported PWB During Temperature Cycling,” Proceedings 48th IEEE Electronic Components and Technology Conference, pp. 345-352.
-
(1998)
Proceedings 48Th IEEE Electronic Components and Technology Conference
, pp. 345-352
-
-
Polsky, Y.1
Ume, C.2
Southerlin, W.3
-
6
-
-
0034219497
-
A Comparison of PWB Warpage Due to Simulated Infrared and Wave Soldering Processes
-
(accepted for publication)
-
Polsky, Y., Southerlin, W., and Ume, C., 2000, “A Comparison of PWB Warpage Due to Simulated Infrared and Wave Soldering Processes,” IEEE, CPMT, Part C (accepted for publication).
-
(2000)
IEEE, CPMT, Part C
-
-
Polsky, Y.1
Southerlin, W.2
Ume, C.3
-
7
-
-
0026390272
-
Measurement of Thermally Induced Warpage in Printed Wiring Boards
-
Conference Proceedings, ASME, New York
-
Martin, T., Yeh, C., and Ume, C., 1991, “Measurement of Thermally Induced Warpage in Printed Wiring Boards,” Manufacturing Processes and Materials Challenges in Microelectronic Packaging, 131, Conference Proceedings, ASME, New York, pp. 43-47.
-
(1991)
Manufacturing Processes and Materials Challenges in Microelectronic Packaging
, vol.131
, pp. 43-47
-
-
Martin, T.1
Yeh, C.2
Ume, C.3
-
8
-
-
0026377958
-
Correlation of Analytical and Experimental Approaches to Thermo-Mechanical Design
-
Atlanta
-
Yeh, C., Ume, C., Martin, T., and Fulton, B., 1991, “Correlation of Analytical and Experimental Approaches to Thermo-Mechanical Design,” American Society of Mechanical Engineers, Winter Annual Meeting, Atlanta, pp. 1-9.
-
(1991)
American Society of Mechanical Engineers, Winter Annual Meeting
, pp. 1-9
-
-
Yeh, C.1
Ume, C.2
Martin, T.3
Fulton, B.4
-
9
-
-
0026393821
-
Experimental and Analytical Investigation of Thermally Induced Warpage for Printed Wiring Boards
-
Yeh, C., Banerjee, K., Martin, T., Umeagukwu, C., Stafford, J., and Wyatt, K., 1991, “Experimental and Analytical Investigation of Thermally Induced Warpage for Printed Wiring Boards,” Proceedings IEEE Electronic Components Conference, pp. 382-387.
-
(1991)
Proceedings IEEE Electronic Components Conference
, pp. 382-387
-
-
Yeh, C.1
Banerjee, K.2
Martin, T.3
Umeagukwu, C.4
Stafford, J.5
Wyatt, K.6
-
10
-
-
0027887097
-
Correlation of Analytical and Experimental Approaches to Determine Thermally Induced PWB Warpage
-
Yeh, C., Ume, C., Fulton, R., Wyatt, K., and Stafford, J., 1993, “Correlation of Analytical and Experimental Approaches to Determine Thermally Induced PWB Warpage,” IeEe Trans. Compon., Hybrids, Manuf. Technol., 16, pp. 986-995.
-
(1993)
Ieee Trans. Compon., Hybrids, Manuf. Technol
, vol.16
, pp. 986-995
-
-
Yeh, C.1
Ume, C.2
Fulton, R.3
Wyatt, K.4
Stafford, J.5
-
11
-
-
0022275802
-
Residual Stresses and Warpage in Circuit Board Composite Laminates
-
Grenelefe, FL
-
Zewi, I., Daniel, I., and Gotro, J., 1985, “Residual Stresses and Warpage in Circuit Board Composite Laminates,” Proceedings 1985 SEM Fall Conference on Experimental Mechanics: Transducer Technology for Physical Measurements, Grenelefe, FL, pp. 19-26.
-
(1985)
Proceedings 1985 SEM Fall Conference on Experimental Mechanics: Transducer Technology for Physical Measurements
, pp. 19-26
-
-
Zewi, I.1
Daniel, I.2
Gotro, J.3
-
12
-
-
0003713904
-
-
Springer-Verlag, New York
-
Post, D., Han, B., and Ifju, P., 1994, High Sensitivity Moire, Springer-Verlag, New York.
-
(1994)
High Sensitivity Moire
-
-
Post, D.1
Han, B.2
Ifju, P.3
-
13
-
-
85025229509
-
-
Anaheim, CA
-
Liu, S., Qian, Z., and Yeh, C. P., (editors), 1998, Proceedings of the 1998 ASME International Mechanical Engineering Congress and Exposition, Anaheim, CA.
-
(1998)
Proceedings of the 1998 ASME International Mechanical Engineering Congress and Exposition
-
-
Liu, S.1
Qian, Z.2
Yeh, C.P.3
-
14
-
-
0027743714
-
Out-of-Plane Displacement Measurement of Printed Circuit Board by Shadow Moire With Variable Sensitivity
-
ASME EEP, 4-1
-
Han, B., Guo, Y., and Choi, H., 1993, “Out-of-Plane Displacement Measurement of Printed Circuit Board by Shadow Moire With Variable Sensitivity,” Advances in Electronic Packaging, ASME EEP, 4-1, pp. 179-185.
-
(1993)
Advances in Electronic Packaging
, pp. 179-185
-
-
Han, B.1
Guo, Y.2
Choi, H.3
-
15
-
-
0005468686
-
Measurement of a Thermally Induced Deformation of a BGA Using Phase-Stepping Shadow Moire
-
Wang, Y., and Hassel, P., (editors), 1998, “Measurement of a Thermally Induced Deformation of a BGA Using Phase-Stepping Shadow Moire,” Experimental/Numerical Mechanics in Electronic Packaging, 2, pp. 32-39.
-
(1998)
Experimental/Numerical Mechanics in Electronic Packaging
, vol.2
, pp. 32-39
-
-
Wang, Y.1
Hassel, P.2
-
16
-
-
0032083804
-
On-line Measurement of a Thermally Induced Warpage of a BGA with a High Sensitive Shadow Moire
-
Wang, Y., and Hassel, P., 1998, “On-line Measurement of a Thermally Induced Warpage of a BGA with a High Sensitive Shadow Moire,” Int. J. Microcircuit Electron. Packag., 21, No. 2, pp. 191-196.
-
(1998)
Int. J. Microcircuit Electron. Packag
, vol.21
, Issue.2
, pp. 191-196
-
-
Wang, Y.1
Hassel, P.2
-
17
-
-
0031094653
-
System for Real-Time Measurement of Thermally Induced PWB/PWA Warpage
-
Stitler, M. R., and Ume, I. C., 1997, “System for Real-Time Measurement of Thermally Induced PWB/PWA Warpage,” ASME J. Electron. Packag., 119, pp. 1-77.
-
(1997)
ASME J. Electron. Packag
, vol.119
, pp. 1-77
-
-
Stitler, M.R.1
Ume, I.C.2
-
18
-
-
0030408751
-
In Process Board Warpage Measurement in a Lab Scale Wave Soldering Oven
-
Stitler, M. R., Ume, I. C., and Leutz, B., 1996, “In Process Board Warpage Measurement in a Lab Scale Wave Soldering Oven,” IEEE Trans. Compon., Packag. Manuf. Technol., Part A, 19, pp. 562-569.
-
(1996)
IEEE Trans. Compon., Packag. Manuf. Technol
, vol.19
, pp. 562-569
-
-
Stitler, M.R.1
Ume, I.C.2
Leutz, B.3
|