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Volumn Part F133492, Issue , 1998, Pages 807-815

A relative comparison of PWB warpage due to simulated infrared and wave soldering processes

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOBILE MANUFACTURE; ELECTRONICS PACKAGING; NETWORK COMPONENTS; OVENS; PRINTED CIRCUIT BOARDS; SOLDERED JOINTS; COMPUTER CONTROL; COMPUTER SIMULATION; INFRARED RADIATION; PRINTED CIRCUIT DESIGN; PRINTED CIRCUIT MANUFACTURE; SOLDERING; THERMAL CYCLING;

EID: 0031633698     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.1998.678800     Document Type: Conference Paper
Times cited : (2)

References (12)
  • 2
    • 0347132129 scopus 로고
    • Application of shadow moire method in electronic packaging
    • Grand Rapids, MI, June 12-14
    • Guo, Y., "Application of Shadow Moire Method in Electronic Packaging, " Proceedings, 1995 SEM Spring Conference and Exhibit, Grand Rapids, MI, June 12-14, 1995.
    • (1995) Proceedings 1995 SEM Spring Conference and Exhibit
    • Guo, Y.1
  • 3
    • 0029325205 scopus 로고
    • Characterizing the temperature dependence of electronic packaging material properties
    • June
    • Fu, G, Ume, G, "Characterizing the Temperature Dependence of Electronic Packaging Material Properties, " JOM, vol. 47, no. 6, pp. 31-35, June, 1995.
    • (1995) JOM , vol.47 , Issue.6 , pp. 31-35
    • Fu, G.1    Ume, G.2
  • 4
    • 0347132129 scopus 로고
    • Applicalson of shadow moire method in electronic packaging
    • Grand Rapids, Ml, June 12-14
    • Guo, Y., "ApplicalSon of Shadow Moire Method in Electronic Packaging, " Proceedings, 1995 SEM Spring Conference and Exhibit, Grand Rapids, Ml, June 12-14, 1995.
    • (1995) Proceedings 1995 SEM Spring Conference and Exhibit
    • Guo, Y.1
  • 6
    • 0347132130 scopus 로고
    • Leal-Time measurement of printed wiring board flatness in a simulated manufacturing environment
    • Lahaina, Hawaii, March 26-30
    • Tsang, C., et al, "leal-Time Measurement of Printed Wiring Board Flatness in a Simulated Manufacturing Environment, " INTIfRpack '95, Lahaina, Hawaii, March 26-30, 1995.
    • (1995) INTIfRpack '95
    • Tsang, C.1
  • 7
    • 0027887097 scopus 로고
    • Analytical and experimental approaches to determine them ally induced pwb warpage
    • Yeh, C, et al, "Analytical and Experimental Approaches to Determine Them ally Induced PWB Warpage, " IEEE Trans-CHMT, Vol. 16, No. 8 (1993), pp. 986-995.
    • (1993) IEEE Trans-CHMT , vol.16 , Issue.8 , pp. 986-995
    • Yeh, C.1
  • 9
    • 77956978378 scopus 로고
    • Ifhase-measurement interferometry techniques
    • Creath, K., "Ifhase-Measurement Interferometry Techniques, " Progress in Optics, Vol. 26 (1988), pp. 349-393.
    • (1988) Progress in Optics , vol.26 , pp. 349-393
    • Creath, K.1
  • 10
    • 0026408263 scopus 로고
    • Pljased stepped fraction moire
    • Sullivan, J., "Pljased Stepped Fraction Moire, " Experimental Mecha|nics. vol. 31, pp. 373-281, 1991.
    • (1991) Experimental Mechanics , vol.31 , pp. 281-373
    • Sullivan, J.1
  • 11
    • 84975602909 scopus 로고
    • Generalized phase-shifting interferometry
    • Lai, G., et al, "Generalized Phase-Shifting Interferometry, " J. c\pt. Soc. Am. A, Vol. 8 (1991), No. 5, pp. 822-827.
    • (1991) J. Cpt. Soc. Am. A , vol.8 , Issue.5 , pp. 822-827
    • Lai, G.1
  • 12
    • 0030408751 scopus 로고
    • In-Process board warpage measurement in a l∗b scale wave soldering oven
    • Stitler. M. "In-Process Board Warpage Measurement in a L∗b Scale Wave Soldering Oven, " IEEE Trans-CPMT-A, Vol 19 (1994), pp. 562-569.
    • (1994) IEEE Trans-CPMT-A , vol.19 , pp. 562-569
    • Stitler, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.