메뉴 건너뛰기




Volumn Part F133492, Issue , 1998, Pages 345-352

Application of thermoelastic lamination theory to predict warpage of a symmetric and simply supported printed wiring board during temperature cycling

Author keywords

[No Author keywords available]

Indexed keywords

COREMAKING; DIFFERENTIAL EQUATIONS; FORECASTING; LAMINATING; MECHANICAL PROPERTIES; NETWORK COMPONENTS; DEFORMATION; MATHEMATICAL MODELS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; THERMAL CYCLING; THERMAL EFFECTS; THERMOELASTICITY;

EID: 0031625756     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.1998.678717     Document Type: Conference Paper
Times cited : (4)

References (11)
  • 1
    • 84965376672 scopus 로고
    • Thermomechanical behavior of multilayer structures in microelectronics
    • Daniel, I. M., Wang, T., M., Gotro, J. T., "Thermomechanical Behavior of Multilayer Structures in Microelectronics", ASME Journal of Electronic Packaging, Vol. 112, pp. 11-15, 1990.
    • (1990) ASME Journal of Electronic Packaging , vol.112 , pp. 11-15
    • Daniel, I.M.1    Wang, T.M.2    Gotro, J.T.3
  • 2
    • 0027887097 scopus 로고
    • Correlation of analytical and experimental approaches to determine thermally induced PWB Warpage
    • Yen, C, Ume, C, Fulton, K. W., Stafford, J., "Correlation of Analytical and Experimental Approaches to Determine Thermally Induced PWB Warpage", IEEE Trans. Com., Hybrids, Manufact. Tech., Vol. 16, No. 8, pp. 986-995, 1993.
    • (1993) IEEE Trans. Com., Hybrids, Manufact. Tech. , vol.16 , Issue.8 , pp. 986-995
    • Yen, C.1    Ume, C.2    Fulton, K.W.3    Stafford, J.4
  • 3
    • 0027663573 scopus 로고
    • Thermal-mechancial strain characterization for PWBs
    • September
    • Wu, T. Y., Guo, Y., Chen W. T., "Thermal-Mechancial Strain Characterization for PWBs", IBM Journal of Research and Development, Vol. 37, No. 5, pp. 621-634, September, 1993.
    • (1993) IBM Journal of Research and Development , vol.37 , Issue.5 , pp. 621-634
    • Wu, T.Y.1    Guo, Y.2    Chen, W.T.3
  • 4
    • 0031237186 scopus 로고    scopus 로고
    • Finite element analysis of pwb warpage due to the solder masking process
    • September
    • Ume, I. C., Martin, T., Gatro, J. T., "Finite Element Analysis of PWB Warpage Due to the Solder Masking Process", IEEE Trans, on Comp. Packaging and Manuf. Tech., Part A, Vol. 20, No. 3, pp. 295-306, September, 1997.
    • (1997) IEEE Trans, on Comp. Packaging and Manuf. Tech., Part A , vol.20 , Issue.3 , pp. 295-306
    • Ume, I.C.1    Martin, T.2    Gatro, J.T.3
  • 5
    • 0031237186 scopus 로고    scopus 로고
    • Finite element analysis of pwb warpage due cured solder mask-sensitivity analysis
    • September
    • Ume, I. C., Martin, T., "Finite Element Analysis of PWB Warpage Due Cured Solder Mask-Sensitivity Analysis", IEEE Trans, on Comp. Packaging and Manuf. Tech., Part A, Vol. 20, No. 3, pp. 307-316, September, 1997.
    • (1997) IEEE Trans, on Comp. Packaging and Manuf. Tech., Part A , vol.20 , Issue.3 , pp. 307-316
    • Ume, I.C.1    Martin, T.2
  • 8
    • 0004132473 scopus 로고
    • Prentice-Hall Englewood Cliffs, New Jersey
    • Franklin, J. N., Matrix Theory, Prentice-Hall, Englewood Cliffs, New Jersey, 1968.
    • (1968) Matrix Theory
    • Franklin, J.N.1
  • 9
    • 0030400724 scopus 로고    scopus 로고
    • An automated system for temperature dependent mechanical property measurements
    • Atlanta, GA, November, 1996
    • Polsky, Y., Ume, C, "An Automated System for Temperature Dependent Mechanical Property Measurements", 1996 International Mechanical Engineering Congress and Exposition, Atlanta, GA, November, 1996.
    • (1996) International Mechanical Engineering Congress and Exposition
    • Polsky, Y.1    Ume, C.2
  • 10
    • 0031094653 scopus 로고    scopus 로고
    • System for real-time measurement of thermally induced PWB/PWBA Warpage
    • March
    • Stiteler. M. R., Ume, I. C., "System for Real-Time Measurement of Thermally Induced PWB/PWBA Warpage", ASME Journal of Electronic Packaging, Vol. 119, pp. 1-7, March, 1997.
    • (1997) ASME Journal of Electronic Packaging , vol.119 , pp. 1-7
    • Stiteler, M.R.1    Ume, I.C.2
  • 11
    • 0030408751 scopus 로고    scopus 로고
    • In-process board warpage measurement in a lab scale wave soldering oven
    • December
    • Stiteler. M. R., Ume, I. C., Leutz, B., "In-Process Board Warpage Measurement in a Lab Scale Wave Soldering Oven", IEEE Trans, on Comp. Packaging and Manuf. Tech., Part A, Vol. 19, No. 4, pp. 562-569, December, 1996.
    • (1996) IEEE Trans, on Comp. Packaging and Manuf. Tech., Part A , vol.19 , Issue.4 , pp. 562-569
    • Stiteler, M.R.1    Ume, I.C.2    Leutz, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.