The elastic strain and composition of self-assembled GeSi islands on Si(001)

Thin Solid Films

Volumn 367, Issue 1-2, 2000, Pages 171-175

  Krasil'nik, Z F ^a   Dolgov, I V ^a   Drozdov, Yu N ^a   Filatov, D O ^b   Gusev, S A ^a   Lobanov, D N ^a   Moldavskaya, L D ^a   Novikov, A V ^a   Postnikov, V V ^a   Vostokov, N V ^a  

^a INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

^b LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD   (Russian Federation)

Author keywords

Atomic force microscopy; Hut clusters and dome islands; Molecular beam epitaxial growth of GeSi nanoislands; Raman spectroscopy; X ray diffraction

Indexed keywords

EID: 0002638525     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00683-0     Document Type: Article

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