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Volumn 18, Issue 3-4, 2000, Pages 283-294

Strain-induced Kirkendall mixing at semiconductor interfaces

Author keywords

Defects; Interfaces; Interfacial mixing; Irradiation; Semiconductors; Strain

Indexed keywords


EID: 0002360821     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0927-0256(00)00107-5     Document Type: Article
Times cited : (53)

References (38)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.