Combined ultrahigh vacuum scanning tunneling microscope scanning electron microscope system

Review of Scientific Instruments

Volumn 67, Issue 6, 1996, Pages 2269-2273

  Memmert, U ^a   Hodel, U ^a   Hartmann, U ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004007838     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147045     Document Type: Article

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