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Volumn 83, Issue 8, 1999, Pages 1624-1627

Atomic-scale mechanisms of oxygen precipitation and thin-film oxidation of SiC

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[No Author keywords available]

Indexed keywords

EID: 0001638441 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.83.1624 Document Type: Article

Times cited : (104)

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