Effects of piezoelectric field on defect formation, charge transfer, and electron transport at GaN/AlxGa1-xN interfaces

Applied Physics Letters

Volumn 73, Issue 3, 1998, Pages 339-341

  Hsu, L ^a   Walukiewicz, W ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001691595     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121827     Document Type: Article

References (12)

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