Pressure induced deep gap state of oxygen in GaN

Physical Review Letters

Volumn 78, Issue 20, 1997, Pages 3923-3926

  Wetzel, C ^a   Suski, T ^a   Ager, J W ^a   Weber, E R ^a   Haller, E E ^a   Fischer, S ^b   Meyer, B K ^b   Molnar, R J ^c   Perlin, P ^d  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b JUSTUS LIEBIG UNIVERSITY   (Germany)

^c MIT LINCOLN LABORATORY   (United States)

^d UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001449152     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.3923     Document Type: Article

References (27)

1. D. J. Chadi and K. J. Chang, Phys. Rev. Lett. 61, 873 (1988) PRLTAO.
2. D. J. Chadi and K. J. Chang, Phys. Rev. B 39, 10 063 (1989).
3. P. M. Mooney, J. Appl. Phys. 67, R1 (1990).
4. K. Malloy and K. Khatchaturyan, in Imperfections in III/V Materials, Semiconductors and Semimetals, E. R. Weber (Academic Press, Boston, 1993), Vol. 38, p. 235.
5. T. Suski, Mater. Sci. Forum 143–147, 975 (1994).
6. J. Dabrowbski and M. Scheffler, Mater. Sci. Forum 83–87, 735 (1991).
7. J. A. Wolk, W. Walukiewicz, M. L. W. Thewalt, and E. E. Haller, Phys. Rev. Lett. 68, 3619 (1992).
8. N. Koide, H. Kato, M. Sassa, S. Yamasaki, K. Manabe, M. Hashimoto, H. Amano, K. Hiramatsu, and I. Akasaki, J. Cryst. Growth 115, 639 (1991).
9. J. I. Pankove, S. Bloom, and G. Harbeke, RCA Rev. 36, 163 (1975).
10. W. Seifert, R. Franzheld, E. Butter, H. Sobotta, and V. Riede, Cryst. Res. Technol. 18, 383 (1983).
11. P. Boguslawski, E. L. Briggs, and J. Bernholc, Phys. Rev. B 51, 17 255 (1995).
12. J. Neugebauer and C. G. Van de Walle, Phys. Rev. B 50, 8067 (1994) PRBMDO.
13. P. Perlin, I. Gorczyca, N. E. Christensen, I. Grzegory, H. Teisseyre, and T. Suski, Phys. Rev. B 45, 13 307 (1992).
14. C. Wetzel, W. Walukiewicz, E. E. Haller, H. Amano, and I. Akasaki, Mater. Res. Soc. Symp. Proc. 378, 509 (1995).
15. R. J. Molnar, K. B. Nichols, P. Maki, E. R. Brown, and I. Melngailis, Mater. Res. Soc. Symp. Proc. 378, 479 (1995).
16. S. Koynov, M. Topf, S. Fischer, B. K. Meyer, P. Radojkovic, E. Hartmann, and Z. Liliental-Weber (unpublished).
17. W. Götz, N. M. Johnson, C. Chen, H. Liu, C. Kuo, and W. Imler, Appl. Phys. Lett. 68, 3144 (1996).
18. C. Wetzel, W. Walukiewicz, E. E. Haller, J. W. Ager III, I. Grzegory, S. Porowski, and T. Suski, Phys. Rev. B 53, 1322 (1996).
19. T. Azuhata, T. Sota, K. Suzuki, and S. Nakamura, J. Phys. Condens. Matter 7, L129 (1995).
20. T. Kozawa, T. Kachi, H. Kano, Y. Taga, M. Hashimoto, N. Koide, and K. Manabe, J. Appl. Phys. 75, 1098 (1994).
21. P. Perlin, T. Suski, H. Teisseyre, M. Leszczynski, I. Grzegory, J. Jun, S. Porowski, P. Boguslawski, J. Bernholc, J. C. Chervin, A. Polian, and T. D. Moustakas, Phys. Rev. Lett. 75, 296 (1995).
22. C. Wetzel, A. L. Chen, T. Suski, J. W. Ager III, and W. Walukiewicz, Phys. Status Solidi B 198, 243 (1996).
23. J. E. Andrews, A. P. Duhamel, and M. A. Littlejohn, Analytical Chemistry 49, 1536 (1977).
24. C. Wetzel, T. Suski, J. W. Ager III, W. Walukiewicz, S. Fischer, and B. K. Meyer, in 23rd International Conference on the Physics of Semiconductors, Berlin, Germany, 1996 (World Scientific, Singapore, 1996), p. 2929.
25. T. Mattila and R. M. Nieminen, Phys. Rev. B 54, 16 676 (1996).
26. S. Yoshida, S. Misawa, and S. Gonda, J. Appl. Phys. 53, 6844 (1982).
27. P. Perlin, T. Suski, A. Polian, J. C. Chervin, W. Knap, J. Camassel, I. Grzegory, S. Porowski, and J. W. Erickson, Mater. Res. Soc. Symp. Proc. 449, 689 (1997).