Reflection-mode near-field optical microscope with a metallic probe tip for observing fine structures in semiconductor materials

Optics Communications

Volumn 134, Issue 1-6, 1997, Pages 31-35

  Inouye, Yasushi ^a   Kawata, Satoshi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Near field optics; Near field scanning optical microscope; Reflection; Scattering

Indexed keywords

DIFFRACTION GRATINGS; IMAGING TECHNIQUES; LIGHT REFLECTION; LIGHT SCATTERING; METALS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SURFACE STRUCTURE;

NEAR FIELD SCANNING OPTICAL MICROSCOPE;

OPTICAL MICROSCOPY;

EID: 0030786874     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(96)00555-X     Document Type: Article

References (13)

1. U.Ch. Fischer, NATO ASI Series E: Applied Sciences, Vol. 184 eds. R.J. Behm, N. Garcia and H. Rohrer (Kluwer, Dordrecht, 1990) p. 475.
2. D.W. Pohl, Scanning Tunneling Microscopy II, Springer Series in Surface Science, Vol. 28, eds. R. Wiesendanger and H.-J. Güntherodt (Springer Verlag, Berlin/Heidelberg, 1992) p. 233.
3. Y. Inouye and S. Kawata, Optics Lett. 19 (1994) 159.
4. Y. Inouye and S. Kawata, J. Microsc. 178 (1995) 14.
5. S. Kawata and Y. Inouye, Ultramicroscopy 57 (1995) 313.
6. P. Gleyzes, A.C. Boccara and R. Bachelot, Ultramicroscopy 57 (1995) 318.
7. R. Bachelot, P. Gleyzes and A.C. Boccara, Optics Lett. 20 (1995) 1924.
8. F. Zenhausern, M.P. O'Boyle and H.K. Wickramasinghe, Appl. Phys. Lett. 65 (1994) 1623.
9. F. Zenhausem, Y. Martin and H.K. Wickramasinghe, Science 269 (1995) 1083.
10. N.F. van Hulst, M.H.P. Moers, O.F.J. Noordman, R.G. Tack, F.B. Segerink and B. Bolger, Appl. Phys. Lett. 62 (1993) 461.
11. S. Kawata, Y. Inouye and T. Sugiura, Jpn. J. Appl. Phys. 33 (1994) L1725.
12. Y. Nakayama and K. Toyoda, Proc. SPIE 2196 (1994) 74.
13. H. Furukawa and S. Kawata, Optics Comm. 132 (1996) 170.