Positron annihilation states at SiO2/Si interfaces: Evidence of divacancies

Journal of Physics Condensed Matter

Volumn 9, Issue 48, 1997, Pages 10595-10601

  Kauppinen, H ^a   Corbel, C ^a,c   Liszkay, L ^a,d   Laine, T ^a   Oila, J ^a   Saarinen, K ^a   Hautojarvi P ^a   Barthe, M F ^b   Blondiaux, G ^b  

^a AALTO UNIVERSITY   (Finland)

^b CNRS   (France)

^c DIF   (France)

^d WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001625791     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/9/48/005     Document Type: Article

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