Study of the SiO2-Si interface using variable energy positron two-dimensional angular correlation of annihilation radiation

Physical Review Letters

Volumn 76, Issue 12, 1996, Pages 2157-2160

  Peng, J P ^a   Lynn, K G ^a   Asoka Kumar, P ^a   Becker, D P ^a   Harshman, D R ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 7244226248     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.2157     Document Type: Article

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