Strain variations in InGaAsP/InGaP superlattices studied by scanning probe microscopy

Applied Physics Letters

Volumn 72, Issue 14, 1998, Pages 1727-1729

  Chen, Huajie ^a   Feenstra, R M ^a   Goldman, R S ^b   Silfvenius, C ^c   Landgren, G ^c  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001547330     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121165     Document Type: Article

References (18)

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