Application of scanning probe microscopies to oxide catalysts

Current Opinion in Solid State and Materials Science

Volumn 3, Issue 4, 1998, Pages 343-353

  Gaigneaux, Eric M ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

AFM atomic force microscope (y, ies); EFM electrical force microscope (y, ies); HREM high resolution microscope (y); LFM lateral force microscope (y); MFM magnetic force microscope (y); NC AFM (noncontact AFM); SCM scanning capacitance microscope (y)

Indexed keywords

EID: 0001543697     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0286(98)80043-0     Document Type: Article

References (88)

1. Binnig G, Rohrer H. Scanning tunneling microscopy. IBM J Res Develop. 30:1986;3555.
2. Hansma PK, Elings VB, Marti O, Bracker CE. Scanning tunneling microscopy and atomic force microscopy: application to biology and technology. Science. 242:1988;209-216.
3. Kuk Y, Silverman PJ. Scanning tunneling microscope instrumentation. Rev Sci Instrum. 60:1989;165-181.
4. Weisenhorn L, Hansma PK, Albrecht TR, Quate CF. Forces in atomic force microscopy in air and water. Appl Phys Lett. 54:1989;2651-2653.
5. Quate CF. The AFM as a tool for surface imaging. Surf Sci. 299/300:1994;980-995.
6. Zhon Q. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy. Surf Sci Lett. 290:1993;L688-L692.
7. Feenstra RM, Stroscio JA, Tersoff J, Fein AP. Atom-selective imaging of the GaAs (110) surface. Phys Rev Lett. 58:1987;1192-1195.
8. Frisbie CD, Rozsnyai A, Noy A, Wrighton MS, Lieber CM. Functional group imaging by chemical force microscopy. Science. 265:1994;2071-2074.
9. Grütter P. An Introduction to magnetic force microscopy. MSA Bulletin. 24:1994;416-425.
10. Maywald M, Pylkki RJ, Balk LJ. Imaging of local thermal and electrical conductivity with SPM. Scanning Microsc. 8:1994;181-188.
11. Matey JR, Blanc J. Scanning capacitance microscopy. J Appl Phys. 57:1985;1437-1444.
12. Force and tunneling microscopy. Chem Rev. 97:1997;1015-1230 This issue proposes an exhaustive review of the applications of SPM to inorganic materials, in particular, metal and alloy surfaces.
13. Nanoscale characterization of materials. MRS Bulletin. 22:1997;1-80 An issue reviewing the main current possibilities of imaging materials at the nanometric scale.
14. Gewirth AA, Niece BK. Electrochemical applications of in situ scanning probe microscopy. Chem Rev. 97:1997;1129-1162.
15. Wagner M, Wagner T, Carroll DL, Marien J, Bonnell DA, Rühle M. Model systems for metal-ceramic interface studies. MRS Bulletin. 22:1997;42-48.
16. Wong TKS, Man WK. Scanning probe microscopy and tunneling measurements of polycrystalline tin oxide films. Thin Solid Films. 287:1996;45-50.
17. Kaplan L, Rusman I, Boxman RL, Goldsmith S, Nathan M, BenJacob E. STM and XPS study of filtered vacuum arc deposited Sn-O films. Thin Solid Films. 291:1996;355-361.
18. Kasiviswanathan S, Srinivas V, Kar AK, Mathur BK, Chopra KL. Observation of deviation of electronic behaviour of indium tin oxide film at grain boundary using scanning tunneling microscope. Solid State Commun. 101:1997;831-834.
19. Kawai T, Kanai M. Superconductivity and scanning tunneling microscopy (STM) spectroscopy (STS) of transition metal oxide artificial lattices. J Low Temp Phys. 105:1996;1349-1358.
20. Zhang LP, Kuhn M, Diebold U. Growth, structure and thermal properties of chromium oxide films on Pt (111). Surf Sci. 375:1997;1-12.
21. Ricotea J, Snoeck E, Coratger R, Pardo L. Microstructural studies of sol-gel processed Sm-modified lead titanate thin films. J Phys Chem Solids. 59:1998;151-157.
22. CastroRodriguez R, Vasco E, Leccabue F, Watts BE, Zapata Torres M, Oliva AI. Nucleation of strontium titanate films grown by PLD on silicon: a kinetic model. Thin Solid Films. 307:1997;306-310.
23. Rella R, Serra A, Siciliano P, Vasanelli L, De G, Liciulli A, Quirini A. Tin oxide-based gas sensors prepared by the sol-gel process. Sensors Actuators B Chem. 44:1997;462-467 It is shown that simple Pd-doping of tin oxide induces an improvement of its sensitivity as a gas sensor and this is related to modifications of the microroughness of the film.
24. 3 thin films deposited by sol-gel processing. Ferroelectrics. 203:1997;119.
25. 6, a new perovskite substrate, by pulsed laser ablation. Physica C. 290:1997;105-108.
26. Vellaikal M, Kingon AI. Electrical and microstructural characterization of lead titanate thin films deposited by metal-organic chemical vapor deposition onto platinum and magnesium oxide. Thin Solid Films. 287:1996;139-145.
27. 2 films by atomic force microscopy and spectroscopy ellipsometry. J Vac Sci Technol B. 14:1996;3436-3444.
28. 3 substrates by a molecular-beam-epitaxy method using oxygen radicals. J Appl Phys. 81:1997;693-697.
29. Di Chiara A, Lombardi F, Granozio FM, di Uccio US, Valentino M, Tafuri F, Del Vecchio A, De Riccardi MF, Tapfer L. Structure and morphology of MgO/YBCO bilayers for biepitaxial junctions. Physica C. 273:1996;30-40.
30. Cui DF, Lu HB, Wang HS, Chen ZH, Zhou YL, Yang GZ, Tao HJ, Li L. Atomic force microscopy studies of barium titanate thin films prepared by laser molecular beam epitaxy. Chinese Phys Lett. 14:1997;134-137.
31. Matsuura N, Johnson DJ, Amm DT. Fabrication of cadmium oxide thin films using Langmuir-Blodgett deposition technique. Thin Solid Films. 295:1997;260-265.
32. Rickerby DG, Horrillo MC, Santos JP, Serrini P. Microstructural characterization of nanograin tin oxide gas sensors. Nanostructured Mater. 9:1997;43-52 The paper relates the sensitivity of a tin oxide film as a nitrogen dioxide and carbon monoxide sensor to its microroughness and continuity.
33. 3 thin films. Thin Solid Films. 299:1997;119-124.
34. 3 (100). J Chem Phys. 108:1998;1645-1652.
35. 3 observed by atomic force microscope. Ferroelectrics. 203:1997;221-225.
36. 2 powder.
37. 16. J Catal. 159:1996;401-409.
38. Street SC, Xu C, Goodman. The physical and chemical properties of ultrathin oxide films. Annu Rev Phys Chem. 48:1997;43-68.
39. 2 is investigated by AFM and correlated to the mechanism of growth, namely to the nature of the ion migrating from one phase to the other.
40. Ritter M, Ranke W, Weiss W. Growth and structure of ultrathin FeO films on Pt (111) studied by STM and LEED. Phys Rev B. 57:1998;7240-7251.
41. Takeuchi I, Sharma RP, Choopun S, Lobb CJ, Venkatesan T. Ion milling damage and regrowth of oxide substrates studied by ion channeling and atomic force microscopy. Appl Phys Lett. 70:1997;3098-3100.
42. 3 by diffusion doping. Appl Phys A Mater Sci Process. 64:1997;33-44.
43. Gai-Boyes PL. Defects in oxide catalysts: fundamental studies of catalysis in action. Appl Phys A Mater Sci Process. 64:1997;33-44.
44. Boyes ED, Gai PL. Environmental high resolution electron microscopy and applications to chemical science. Ultramicroscopy. 67:1997;219-232 This paper describes the design of an 'environmental HREM' which allows the observation of samples kept in a controlled atmosphere at a temperature up to 1000°C. This microscope makes possible in situ studies of dyanmic chemical reactions at the atomic scale.
45. Somorjai GA, Yang MX. New directions of catalysis research. J Mol Catal A Chem. 115:1997;389-403.
46. Iwasawa Y. Characterization and chemical design of oxide surfaces. Studies Surf Sci Catal. 101:1996;21-34.
47. 2-x (110) surface. Surf Sci. 278:1992;146-156.
48. 2 (110) surfaces: STM and photoemission studies. Vacuum. 48:1997;601-605.
49. 2 (110)-(1×1) surface by means of STM, TDS, XPS and MD calculation in relation to surface acid-base interaction. J Chem Soc Faraday Trans. 94:1998;161-166 This paper is a debate on the nature of adsorption of pyridine and its derivatives on titania starting from among others STM-UHV highly-resolved pictures.
50. 2 surface. Jpn J Appl Phys. 33:1994;L1338-L1341.
51. 2 (110) surfaces. Phys Rev B. 56:1997;10544-10548.
52. 2 (110) surface by noncontact atomic force microscopy. Phys Rev Lett. 79:1997;4202-4205 Using NC-AFM, the authors show the true topography of the titania (110) surface: corrugation over the surface are due to rows of bridging oxygen atoms, single oxygen atom vacancies are also shown. The technique overcomes the difficulties in interpreting the topography of surfaces from STM pictures allowing, in contrast to contact AFM, the visualization of a true atomic resolution.
53. 2 (110) surface by non-contact atomic force microscopy. Chem Phys Lett. 280:1997;296-301 A most promising result, using SPM on oxides is presented, that is the possibility to image adsorbed molecules using noncontact AFM.
54. Leibsle FM, Murray PW, Francis SM, Thorntin G, Bowker M. One-dimensional reactivity in catalysis studied with the scanning tunneling microscope. Nature. 363:1993;706-709.
55. Francis SM, Leibsle FM, Haq S, Xiang N, Bowker M. Methanol oxidation on Cu (110). Surf Sci. 315:1994;284-292.
56. Leibsle FM, Francis SM, Davis R, Xiang N, Haq S, Bowker M. Scanning tunneling microscopy studies of formaldehyde synthesis on Cu (110). Phys Rev Lett. 72:1994;2569-2572.
57. McIntrye BJ, Salmeron MB, Somorjai GA. A scanning tunneling micrsocope that operates at high pressures and high temperatures (430K) and during catalytic reactions. Catal Lett. 14:1992;263-269.
58. 13. Surf Sci. 367:1996;87-95.
59. 5 (001) using ambient contact AFM. This is the oxygen atom bridging two V atoms.
60. 2 (110) surface is shown (when annealed under oxygen) in relation to the progressive removal of the bridging oxygen layer. This paper may be crucial to understanding the catalytic behavior of tin oxide in Mars and van Krevelen-type oxidations.
61. 3 (001) surfaces using scanning tunneling microscopy. Surf Sci. 369:1996;343-350.
62. 52 (100) surface using scanning tunneling microscopy. Surf Sci. 292:1993;261-266.
63. 11 (100). J Solid State Chem. 124:1996;104-155.
64. 2 (111) surfaces studied by scanning tunneling microscopy. Phys Rev Lett. 79:1997;4222-4225.
65. 3 (100) surface by electronic structure calculations. Surf Sci. 370:1997;245-251.
66. 4 (100) grown by molecular beam epitaxy. Surf Sci. 373:1997;85-94.
67. Weiss W, Ritter D, Zscherpel D, Swoboda M, Schlögl R. Multicomponent surface analysis system combined with high pressure reaction cells for studying metal oxide model catalysts. J Vac Sci Technol A. 16:1998;21-29.
68. 3 (010) surface during reduction reactions. J Catal. 163:1996;12-17.
69. 3. The results clarify the understanding of the remote control mechanism theory.
70. 3 is interpreted to act as a hydrogen pump, which leads to a deep reconsideration of the Mars and van Krevelen mechanism commonly accepted in selective oxidation reactions.
71. 2 formation in molecular hydrogen. Surf Sci. 147:1984;396-412.
72. 13. Surf Sci. 36:1973;513-525.
73. 3 (010) surfaces. Surf Sci. 129:1983;155-176.
74. Barber S, Booth J, Pyke DR, Reid R, Tilley RJD. The influence of crystallographic shear planes on the behavior of molybdenum-tungsten oxide catalysts for the selective oxidation of propene. J Catal. 77:1982;180-191.
75. Gai PL, Labum PA. Electron microscopy studies relating to methanol oxidation over ferric molybdate and molybdenum trioxide catalysts. J Catal. 94:1985;79-96.
76. Gai PL, Kourtakis K. Solid-state defect mechanism in vanadyl pyrophosphate catalysts: implications for selective oxidation. Science. 267:1995;661-663.
77. Gai PL, Kourtakis K, Coulson DR, Sonnichsen GC. HREM microstructural studies on the effect of steam exposure and cation promoters on vanadium phosphorus oxides - new correlations with n-butane oxidation reaction chemistry. J Phys Chem B. 101:1997;9916-9925.
78. Gai PL. A new structural transformation mechanism in catalytic oxides. Acta Cryst B. 53:1997;346-352 The observation of the activation of VPO catalysis performed in situ by environmental HREM in the reaction conditions for the oxidation of n-butane to maleic anhydride. This paper has important implications in oxidation catalysis on oxide catalysts.
79. Holt SA, Jones CF, Watson GS, Crossley A, Johnson C, Sofield CJ, Myrha S. Surface modification of MgO substrates from aqueous exposure: an atomic force microscopy study. Thin Solid Films. 292:1997;96-102.
80. van Wijk R, van Vliet DP, ten Grotenhuis E, Gijzeman OLJ, Geus JW. The influence of calcination on the stability of copper particles supported on oxidized Si (100). Appl Surf Sci. 108:1997;263-272.
81. x thin films. Ber Bunsen Gesellschaft Phys Chem Chem Phys. 102:1998;103-110.
82. Weidenhof V, Gropper F, Müller U, Marosi L, Cox G, Houbertz R, Hartmann U. Morphological investigations on mesostructured metal oxides. J Mater Res. 12:1997;1634-1639.
83. 3 thin film due to their difference in friction coefficients.
84. 3 (010) faces as coke using a conventional non-analytical AFM.
85. Friedbacher G, Hansma PK, Ramli E, Stucky GD. Imaging powders with atomic force microscope: from biominerals to commercial materials. Science. 253:1991;1261-1263.
86. Occelli ML, Drake B, Gould SAC. Characterization of pillared montmorillonites with an atomic force microscope (AFM). J Catal. 142:1993;337-348.
87. Müller WT, Klein DL, Lee T, Clarke J, McEuen PL, Schultz PG. A strategy for the chemical synthesis of nanostructures. Science. 268:1995;272-273.
88. Xu C, Goodman DW. Morphology and local electronic structure of metal particles on metal oxide surfaces: a scanning tunneling microscope and scanning tunneling spectroscopic study. Chem Phys Lett. 263:1996;13-18.