Nanoscale characterization of materials

MRS Bulletin

Volumn 22, Issue 8, 1997, Pages 17-18

  Yu, Edward T ^a   Pennycook, Stephen J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; ELECTRON MICROSCOPY; INTERFACES (MATERIALS); NANOTECHNOLOGY; OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

NANOMETER SCALE; SCANNING PROBE TECHNIQUES;

NANOSTRUCTURED MATERIALS;

EID: 0031209498     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/s0883769400033753     Document Type: Article

References (0)