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1
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0031275422
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Electromagnetic power provided by sources within multilayer optics: Free-space and modal patterns
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C. Amra and S. Maure, “Electromagnetic power provided by sources within multilayer optics: free-space and modal patterns,” J. Opt. Soc. Am. A 14, 3102–3113 (1997).
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(1997)
J. Opt. Soc. Am
, vol.A14
, pp. 3102-3113
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Amra, C.1
Maure, S.2
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2
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0005331143
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Sources within multilayer optics: The energy balance of a planar microcavity
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internal publication, available on request from the author at the address on the title page
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C. Amra, “Sources within multilayer optics: the energy balance of a planar microcavity,” internal publication, available on request from the author at the address on the title page;
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Amra, C.1
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3
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84894397238
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Effets d’interfaces et de volume dans le processus des pertes optiques: Application a la diffusion piégée et aux cavités luminescentes
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Ph.D. dissertation University Aix-Marseille III, Marseille, France
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S. Maure, “Effets d’interfaces et de volume dans le processus des pertes optiques: application a la diffusion piégée et aux cavités luminescentes,” Ph.D. dissertation (University Aix-Marseille III, Marseille, France, 1996).
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(1996)
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Maure, S.1
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5
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0018996455
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Light scattering from multilayer optics: Comparison of theory and experiment
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J. M. Elson, J. P. Rahn, and J. M. Bennett, “Light scattering from multilayer optics: comparison of theory and experiment,”Appl. Opt. 19, 669–679 (1980).
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(1980)
Appl. Opt
, vol.19
, pp. 669-679
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Elson, J.M.1
Rahn, J.P.2
Bennett, J.M.3
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6
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0027685097
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Relation between light scattering and microstructure of optical thin films
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A. Duparre and S. Kassam, “Relation between light scattering and microstructure of optical thin films,” Appl. Opt. 32, 5475–5480 (1993).
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(1993)
Appl. Opt
, vol.32
, pp. 5475-5480
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Duparre, A.1
Kassam, S.2
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7
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0027680901
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From light scattering to the microstructure of thin film multilayers
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C. Amra, “From light scattering to the microstructure of thin film multilayers,” Appl. Opt. 32, 5481–5491 (1993).
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(1993)
Appl. Opt
, vol.32
, pp. 5481-5491
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Amra, C.1
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8
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0020834662
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Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation-length, and roughness cross-correlation properties
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J. M. Elson, J. P. Rahn, and J. M. Bennett, “Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation-length, and roughness cross-correlation properties,” Appl. Opt. 22, 3207–3219 (1983).
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(1983)
Appl. Opt
, vol.22
, pp. 3207-3219
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Elson, J.M.1
Rahn, J.P.2
Bennett, J.M.3
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9
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0028367822
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Light scattering from multilayer optics. I. tools of investigation
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C. Amra, “Light scattering from multilayer optics. I. Tools of investigation,” J. Opt. Soc. Am. A 11, 197–210 (1994);
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(1994)
J. Opt. Soc. Am
, vol.A11
, pp. 197-210
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Amra, C.1
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10
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0028368291
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Ii. Application to experiment
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“II. Application to experiment,” J. Opt. Soc. Am. A 11, 211–226 (1994).
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(1994)
J. Opt. Soc. Am
, vol.A11
, pp. 211-226
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11
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0027677835
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Comparison of surface and bulk scattering in optical coatings
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C. Amra, C. Grezes-Besset, and L. Bruel, “Comparison of surface and bulk scattering in optical coatings,” Appl. Opt. 32, 5492–5503 (1993).
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(1993)
Appl. Opt
, vol.32
, pp. 5492-5503
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Amra, C.1
Grezes-Besset, C.2
Bruel, L.3
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12
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0030270174
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Multiscale roughness in optical multilayers: Atomic force microscopy and light scattering
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C. Deumie, R. Richier, P. Dumas, and C. Amra, “Multiscale roughness in optical multilayers: atomic force microscopy and light scattering,” Appl. Opt. 35, 5583–5593 (1996).
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(1996)
Appl. Opt
, vol.35
, pp. 5583-5593
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Deumie, C.1
Richier, R.2
Dumas, P.3
Amra, C.4
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13
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84975605156
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Light scattering from the volume of optical thin films: Theory and experiment
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S. Kassam, A. Duparre, K. Helm, P. Bussemer, and J. Neubert, “Light scattering from the volume of optical thin films: theory and experiment,” Appl. Opt. 31, 1304–1313 (1992).
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(1992)
Appl. Opt
, vol.31
, pp. 1304-1313
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Kassam, S.1
Duparre, A.2
Helm, K.3
Bussemer, P.4
Neubert, J.5
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14
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0027543540
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First-order vector theory of bulk scattering in optical multilayers
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C. Amra, “First-order vector theory of bulk scattering in optical multilayers,” J. Opt. Soc. Am. A 10, 365–374 (1993).
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(1993)
J. Opt. Soc. Am
, vol.A10
, pp. 365-374
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Amra, C.1
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15
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0030271035
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Low-level scattering and localized defects
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S. Maure, G. Albrand, and C. Amra, “Low-level scattering and localized defects,” Appl. Opt. 35, 5572–5582 (1996).
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(1996)
Appl. Opt
, vol.35
, pp. 5572-5582
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Maure, S.1
Albrand, G.2
Amra, C.3
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16
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0030269610
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Ellipsometry of light scattering from multilayer coatings
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C. Deumie, H. Giovannini, and C. Amra, “Ellipsometry of light scattering from multilayer coatings,” Appl. Opt. 35, 5600–5608 (1996).
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(1996)
Appl. Opt
, vol.35
, pp. 5600-5608
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Deumie, C.1
Giovannini, H.2
Amra, C.3
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17
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85010154435
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Roughness-induced absorption in optical multilayers
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OSA Annual Meeting, Rochester, N.Y., October 20–24
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C. Amra and S. Maure, “Roughness-induced absorption in optical multilayers,” presented at Thin-Films Symposium, OSA Annual Meeting, Rochester, N.Y., October 20–24 (1996).
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(1996)
Presented at Thin-Films Symposium
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Amra, C.1
Maure, S.2
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18
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0004091562
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CRC Press, Boca Raton, Fla
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H. Yokoyama and K. Ujihara, Spontaneous Emission and Laser Oscillation in Microcavities, Laser and Optical Science and Technology Series (CRC Press, Boca Raton, Fla., 1995).
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(1995)
Spontaneous Emission and Laser Oscillation in Microcavities, Laser and Optical Science and Technology Series
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Yokoyama, H.1
Ujihara, K.2
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20
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0001542750
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Modal analysis of spontaneous emission in a planar microcavity
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H. Rigneault and S. Monneret, “Modal analysis of spontaneous emission in a planar microcavity,” Phys. Rev. A 54, 2356–2368 (1996).
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(1996)
Phys. Rev
, vol.A54
, pp. 2356-2368
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Rigneault, H.1
Monneret, S.2
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22
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0005362244
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Theory and application of antiscattering single layers; antiscattering reflection coatings
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C. Amra, G. Albrand, and P. Roche, “Theory and application of antiscattering single layers; antiscattering reflection coatings,” Appl. Opt. 25, 2695–2702 (1986).
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(1986)
Appl. Opt
, vol.25
, pp. 2695-2702
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Amra, C.1
Albrand, G.2
Roche, P.3
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23
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84975608632
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Sensitive photothermal deflection technique for measuring absorption in optically thin media
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A. C. Boccara, D. Fournier, W. B. Jackson, and N. M. Amer, “Sensitive photothermal deflection technique for measuring absorption in optically thin media,” Opt. Lett. 5, 377–379 (1980).
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(1980)
Opt. Lett
, vol.5
, pp. 377-379
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Boccara, A.C.1
Fournier, D.2
Jackson, W.B.3
Amer, N.M.4
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24
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0000851767
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Characterization of optical coatings by photothermal deflection
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M. Commandre and P. Roche, “Characterization of optical coatings by photothermal deflection,” Appl. Opt. 35, 5021–5034 (1996).
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(1996)
Appl. Opt
, vol.35
, pp. 5021-5034
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Commandre, M.1
Roche, P.2
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25
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0027677462
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Multiwavelength (0.45-10.6-mm) angle-resolved scatterometer or how to extend the optical window
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C. Amra, D. Torricini, and P. Roche, “Multiwavelength (0.45-10.6-mm) angle-resolved scatterometer or how to extend the optical window,” Appl. Opt. 32, 5462–5474 (1993).
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(1993)
Appl. Opt
, vol.32
, pp. 5462-5474
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Amra, C.1
Torricini, D.2
Roche, P.3
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26
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84975655868
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The role of interface correlation in light scattering by a multilayer
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C. Amra, J. H. Apfel, and E. Pelletier, “The role of interface correlation in light scattering by a multilayer,” Appl. Opt. 31, 3134–3151 (1992).
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(1992)
Appl. Opt
, vol.31
, pp. 3134-3151
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Amra, C.1
Apfel, J.H.2
Pelletier, E.3
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