Electromagnetic power provided by sources within multilayer optics: Free-space and modal patterns

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 14, Issue 11, 1997, Pages 3102-3113

  Amra, Claude ^a   Maure, Sophie ^a  

^a CNRS   (France)

Author keywords

Absorption; Bulk inhomogeneity; Defect induced absorption; Free space pattern; Guided modes; Light scattering; Microcavities; Multilayers; Optical power; Poynting flux; Roughness; Roughness coupling; Thin films

Indexed keywords

CALCULATIONS; DENSITY (OPTICAL); ELECTROMAGNETIC FIELD THEORY; LIGHT ABSORPTION; LIGHT SCATTERING; MATHEMATICAL MODELS; MIRRORS; MULTILAYERS; THIN FILMS;

DEFECT INDUCED ABSORPTION; ENERGY BALANCE; MICRO CAVITIES; OPTICAL POWER; POYNTING FLUX; ROUGHNESS COUPLING;

OPTICS;

EID: 0031275422     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.14.003102     Document Type: Article

References (23)

1. C. Amra and S. Maure, “Roughness-induced absorption in optical multilayers,” presented at the Thin-Films Symposium, OSA Annual Meeting, Rochester, New York, October 20-24, 1996.
2. H. Yokoyama and K. Ujihara, Spontaneous Emission and Laser Oscillation in Microcavities, Laser and Optical Science and Technology Series (CRC Press, Boca Raton, Fla., 1995).
3. A. W. Snyder and J. D. Love, Optical Waveguide Theory (Chapman & Hall, London, 1983).
4. H. Rigneault and S. Monneret, “Modal analysis of sponta-neous emission in a planar microcavity,” Phys. Rev. A 54, 2356-2368 (1996).
5. C. Amra, “Sources within multilayer optics: the energy balance of a planar microcavity,” internal publication avail-able on request from the author at the address on the title page
6. S. Maure, “Effets d'interfaces et de volume dans le processus des pertes optiques: application a la diffusion piegee et aux cavites luminescentes,” Ph.D. dissertation (University Aix-Marseille III, Marseille, France, 1996).
7. C. Amra, “Sources within multilayer optics: the energy balance of a planar microcavity,” internal publication avail-able on request from the author at the address on the title page
8. C. Amra and S. Maure, “Mutual coherence and conical pattern of sources optimally excited within multilayer optics,” J. Opt. Soc. Am. A 14, 3114-3124 (1997).
9. J. Bennett and L. Mattson, Introduction to Surface Rough-ness and Scattering (Optical Society of America, Washington, D.C., 1989).
10. J. M. Elson, J. P. Rahn, and J. M. Bennett, “Light scatter-ing from multilayer optics: comparison of theory and experiment,” Appl. Opt. 19, 669-679 (1980).
11. A. Duparre, and S. Kassam, “Relation between light scat-tering and microstructure of optical thin films,” Appl. Opt. 32, 5475-5480 (1993).
12. C. Amra, “From light scattering to the microstructure of thin film multilayers,” Appl. Opt. 32, 5481-5491 (1993).
13. J. M. Elson, J. P. Rahn, and J. M. Bennett, “Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation-length, and roughness cross-correlation properties,” Appl. Opt. 22, 3207-3219 (1983).
14. C. Amra, “Light scattering from multilayer optics. I. Tools of investigation,” J. Opt. Soc. Am. A 11, 197-210 (1994)
15. ''II. Application to experiment,” J. Opt. Soc. Am. A 11, 211-226 (1994).
16. S. Kassam, A. Duparre, K. Helm, P. Bussemer, and J. Neu- bert, “Light scattering from the volume of optical thin films: theory and experiment,” Appl. Opt. 31, 1304-1313 (1992).
17. C. Amra, “First-order vector theory of bulk scattering in optical multilayers,” J. Opt. Soc. Am. A 10, 365-374 (1993).
18. C. Amra, C. Grezes-Besset, and L. Bruel, “Comparison of surface and bulk scattering in optical coatings,” Appl. Opt. 32, 5492-5503 (1993).
19. C. Carnigilia, J. Black, S. Watkins, and B. Pond, “Direct observation of waveguided scattered light in multilayer dielectric films,” Appl. Opt. 32, 5504-5510 (1993).
20. S. Maure, G. Albrand, and C. Amra, “Low-level scattering and localized defects,” Appl. Opt. 35, 5572-5582 (1996).
21. C. Deumie, R. Richier, P. Dumas, and C. Amra, “Multiscale roughness in optical multilayers: atomic force microscopy and light scattering,” Appl. Opt. 35, 5583-5593 (1996).
22. C. Deumie, H. Giovannini, and C. Amra, “Ellipsometry of light scattering from multilayer coatings,” Appl. Opt. 35, 5600-5608 (1996).
23. H. A. Macleod, Thin-Film Optical Filters, 2nd ed. (Hilger, Bristol, UK, 1986).