Role of CsF on electron injection into a conjugated polymer

Applied Physics Letters

Volumn 77, Issue 15, 2000, Pages 2403-2405

  Piromreun, Pongpun ^a   Oh, HwanSool ^a,c   Shen, Yulong ^a   Malliaras, George G ^a   Scott, J Campbell ^b   Brock, Phil J ^b  

^a Department of Materials Science and Engineering   (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

^c Konkuk University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001461062     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1317547     Document Type: Article

References (24)

1. J. C. Scott and G. G. Malliaras, in Semiconducting Polymers, edited by P. F. van Hutten and G. Hadziioannou (WILEY-VCH, New York, 1999), pp. 411-461.
2. L. S. Hung, C. W. Tang, and M. G. Mason, Appl. Phys. Lett. 70, 152 (1997).
3. G. E. Jabbour, Y. Kawabe, S. E. Shaheen, J. F. Wang, M. M. Morrell, B. Kippelen, and N. Peyghambarian, Appl. Phys. Lett. 71, 1762 (1997).
4. S. E. Shaheen, G. E. Jabbour, M. M. Morrell, Y. Kawabe, B. Kippelen, N. Peyghambarian, M. F. Nabor, R. Schlaf, E. A. Mash, and N. R. Armstrong, J. Appl. Phys. 84, 2324 (1998).
5. G. E. Jabbour, B. Kippelen, N. R. Armstrong, and N. Peyghambarian, Appl. Phys. Lett. 73, 1185 (1998).
6. T. Mori, H. Fujikawa, S. Tokito, and Y. Taga, Appl. Phys. Lett. 73, 2763 (1998).
7. M. Matsumura, K. Furukawa, and Y. Jinde, Thin Solid Films 331, 96 (1998).
8. M. Matsumura and Y. Jinde, Appl. Phys. Lett. 73, 2872 (1998).
9. D. Yoshimura, T. Yokoyama, E. Ito, H. Ishii, Y. Ouchi, S. Hasegawa, and K. Seki, Synth. Met. 102, 1145 (1999).
10. Q. T. Le, L. Yan, Y. G. Gao, M. G. Mason, D. J. Giesen, and C. W. Tang, J. Appl. Phys. 87, 375 (2000).
11. M. Stossel, J. Staudigel, F. Steuber, J. Blassing, J. Simmerer, and A. Winnacker, Appl. Phys. Lett. 76, 115 (2000).
12. V. E. Choong, S. Shi, J. Curless, and F. So, Appl. Phys. Lett. 76, 958 (2000).
13. J. Yoon, J. J. Kim, T. W. Lee, and O. O. Park, Appl. Phys. Lett. 76, 2152 (2000).
14. G. G. Malliaras, J. R. Salem, P. J. Brock, and J. C. Scott, J. Appl. Phys. 84, 1583 (1998).
15. J. C. Scott, G. G. Malliaras, W. D. Chen, J. C. Breach, J. R. Salem, P. J. Brock, S. B. Sachs, and C. E. D. Chidsey, Appl. Phys. Lett. 74, 1510 (1999).
16. J. C. Scott, J. H. Kaufman, P. J. Brock, R. DiPietro, J. Salem, and J. A. Goitia, J. Appl. Phys. 79, 2745 (1996).
17. A. Ioannidis, J. S. Facci, and M. A. Abkowitz, J. Appl. Phys. 84, 1439 (1998).
18. Although the device with the Al cathode turns on at a lower voltage than the one with the CsF/Al cathode, the onset of radiance seems to be the other way around. This is due to the low sensitivity of the radiometer.
19. G. G. Malliaras, J. R. Salem, P. J. Brock, and J. C. Scott, Phys. Rev. B 58, R13411 (1999).
20. W. H. Kohl, Handbook of Materials and Techniques for Vacuum Devices (AIP, New York, 1995), p. 87.
21. I. H. Campbell, T. W. Hagler, D. L. Smith, and J. P. Ferraris, Phys. Rev. Lett. 76, 1900 (1996).
22. J. M. Bharathan and Y. Yang, J. Appl. Phys. 84, 3207 (1998).
23. Y. Yang (private communication).
24. J. Kido and T. Matsumoto, Appl. Phys. Lett. 73, 2866 (1998).