Hybrid STM/R-SNOM with novel probe

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 199-203

  Tománek, Pavel ^a   Brüstlová, Jitka ^a   Dobis, Pavel ^a   Grmela, Lubomir ^a  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

Near field optical microscopy; Scanning tunneling microscopy instrumentation

Indexed keywords

ETCHING; LASER APPLICATIONS; OPTICAL FIBERS; PROBES; SCANNING TUNNELING MICROSCOPY; SURFACES;

CHEMICAL ETCHING; REFLECTION MODE SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

ARTICLE; INSTRUMENTATION; LASER; OPTICS; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY; TEMPERATURE;

EID: 18544409724     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00119-8     Document Type: Article

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